We experimentally study magnetization aging in a thin-film NiO/Permalloy bilayer. Aging characteristics are nearly independent of temperature below the exchange bias blocking temperature TB, but rapidly vary above it. The dependence on the magnetic history qualitatively changes across TB. The observed behaviors are consistent with the spin glass transition at TB, with significant implications for magnetism and magnetoelectronic phenomena in antiferromagnet/ferromagnet bilayers.The properties of thin-film antiferromagnets (AFs) interfaced with ferromagnets (Fs) first became the subject of intense research in the context of exchange bias (EB) -unidirectional anisotropy acquired by F when the system is cooled through a certain blocking temperature T B [1,2]. They have recently attracted a renewed attention thanks to the high dynamical magnetization frequencies of AFs, enabling applications in fast interconversion and transmission of spin signals [3], and THz optics [4]. Additionally, vanishing magnetization of AFs can enable enhanced spin-transfer efficiency in electronic manipulation of the magnetic states for ultrahigh-density information storage, avoiding the constraints imposed by the angular momentum conservation and the dipolar fields ubiquitous to ferromagnetic systems [5].A number of novel phenomena have been recently observed or predicted for thin AF films, including antiferromagnetic spin-orbit torques [6][7][8], AF magnetoresistance [9], enhanced interconversion between electron spin current and spin waves [3,10], generation of THz signals [4,11], AF exchange springs [12,13], and topological effects [14][15][16]. While some of these phenomena are expected even for standalone AFs, strong exchange coupling at AF/F interfaces provides one of the most efficient approaches to controlling and analyzing the magnetization states of AFs, with the state of F controlled by the magnetic field or spin current, and characterized by the magnetoelectronic or optical techniques. However, despite intense ongoing research, little is known about the dynamical and even static magnetization states of thin AF films in F/AF bilayers.Here, we present measurements of magnetization aging, observed in a thin NiO film after magnetization reversal of an adjacent ferromagnet. Our main result is the observation of an abrupt transition between two qualitatively different aging regimes, which we identify as a glass transition in AF frustrated by the random exchange interaction at the F/AF interface. The insight provided by our findings may enable the implementation of new functionalities in magnetic nanodevices, facilitated by the controlled transition among the multidomain, spinliquid, and spin-glass states of thin-film magnetic systems.The AF in our study was a polycrystalline 15 nmthick NiO layer deposited by reactive sputtering on an oxidized 6 × 6 mm 2 Si substrate. A 10-nm-thick Ni 80 Fe 20 =Permalloy (Py) ferromagnet and a 3 nmthick capping SiO 2 layer were deposited on top. NiO has played a prominent role in recent studies of mag...