2022
DOI: 10.1016/j.jmrt.2022.09.094
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Impact of annealing on the growth dynamics of indium sulphide buffer layers

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Cited by 5 publications
(2 citation statements)
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“…Through X-ray diffraction (XRD) characterization, we found that the as-deposited film is amorphous (Figure 2a). [12,17] To identify the phase of the synthesized materials, we collected the powder generated during the deposition process. Diffraction peaks belonging to In 2 S 3 were detected at 27.51°, 43.76°, and 47.91°(Figure S1, Supporting Information), which correspond to crystal planes of (311), (511), and (440) (JCPDS no.…”
Section: Resultsmentioning
confidence: 99%
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“…Through X-ray diffraction (XRD) characterization, we found that the as-deposited film is amorphous (Figure 2a). [12,17] To identify the phase of the synthesized materials, we collected the powder generated during the deposition process. Diffraction peaks belonging to In 2 S 3 were detected at 27.51°, 43.76°, and 47.91°(Figure S1, Supporting Information), which correspond to crystal planes of (311), (511), and (440) (JCPDS no.…”
Section: Resultsmentioning
confidence: 99%
“…Furthermore, the amorphous properties caused by low-temperature annealing generates negative effect on the conductivity of the film and the quality of the heterojunction. [12,17] To cope with this problem, we applied ZnCl 2 solution to treat In 2 S 3 film, and prepared ZnCl 2 -modified In 2 S 3 buffer layer. Subsequently, we deposited the Sb 2 Se 3 light absorber layer through thermal evaporation method, and fabricated superstrate-type Sb 2 Se 3 solar cells with using In 2 S 3 as a buffer layer.…”
Section: Introductionmentioning
confidence: 99%