2019
DOI: 10.1063/1.5089895
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Impact of ELM control techniques on tungsten sputtering in the DIII-D divertor and extrapolations to ITER

Abstract: The free-streaming plus recycling model (FSRM) has recently been developed to understand and predict tungsten gross erosion rates from the divertor during edge localized modes (ELMs). In this work, the FSRM was tested against experimental measurements of W sputtering during ELMs, conducted via fast WI spectroscopy. Good agreement is observed using a variety of controlling techniques, including gas puffing, neutral beam heating, and plasma shaping to modify the pedestal stability boundary and thus the ELM behav… Show more

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Cited by 25 publications
(33 citation statements)
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“…However, during ELMs, the ion impact energy can be a few keV [11]. The erosion of the tungsten PFCs by ELMs is therefore a concern [36]. On the other hand, the core plasma has a low tolerability to tungsten impurities, as tungsten degrades the core plasma performance [37].…”
Section: Implications For Itermentioning
confidence: 99%
“…However, during ELMs, the ion impact energy can be a few keV [11]. The erosion of the tungsten PFCs by ELMs is therefore a concern [36]. On the other hand, the core plasma has a low tolerability to tungsten impurities, as tungsten degrades the core plasma performance [37].…”
Section: Implications For Itermentioning
confidence: 99%
“…the tungsten ring in the lower divertor [47]. Mixed material DIVIMP-WallDYN modeling [45] including E × B drifts is more consistent with the observed redeposition profile (diamonds in figure 11(a)) than modeling that neglects E × B drifts; however, simulations using 60% of the theoretical drifts Reprinted from [48], with the permission of AIP Publishing.…”
Section: Fundamental Plasma Physics Understanding and Model Validatio...mentioning
confidence: 55%
“…ELMs have the effect of transiently increasing the ion impact energy in the divertor (e.g., see [45]), which causes more Si enrichment of the SiC surface (Figure 3) and more Si physical sputtering (Figure 1). The difference between measurement and model diverges at low values of 𝑇𝑇 𝑒𝑒,𝑑𝑑𝑆𝑆𝑑𝑑 , where intra-ELM impurity source begins to dominate over inter-ELM sources [46]. Si physical sputtering yields from SiC are also rather sensitive to the assumed average ion impact angle.…”
Section: Si Erosionmentioning
confidence: 95%