Impact of Intentional Electromagnetic Interference on Pure Combinational Logic

Abstract

Electromagnetic fault injection is a growing topic when it is applied to jeopardize the security of integrated circuit. Indeed, if the main part of the process will focus on the hardware efficiency of the near-field probes, tweaking properties of the electromagnetic disturbance can also lead to the success of the attack. In this paper, we are presenting characterization results of intentional electromagnetic interference by measuring its impact within the target, and more precisely on the propagation delay of a combinational logic path. The evaluation of the impact shows that the electromagnetic coupling between the probe and the integrated circuit strongly depends on the characterized properties. Index Terms-Side-channel attacks, immunity testing, probes, field programmable gate array.

Harmonic Response of Ring Oscillators under Single ElectroMagnetic Pulsed Fault Injection

“…Fault models are proposed in the state of the art, but remain to be refined. Within this context, this paper aims to more comprehensively model electromagnetic faults on a cascade of combinational logic gates as previously studied in [3], except that here we focus particularly on the case of Ring Oscillators (ROs) made by cascaded inverters and implemented in a Field-Programmable Gate Array (FPGA) chip.…”