2015 IEEE 17th Electronics Packaging and Technology Conference (EPTC) 2015
DOI: 10.1109/eptc.2015.7412428
|View full text |Cite
|
Sign up to set email alerts
|

Impact of mold compound on reliability performance in roughened Ni/Pd/Au-Ag preplated leadframe package

Wu-Hu Li
1
,
Khai Seen Yong
2
,
Albert Acuesta
3
et al.
Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2017
2017
2022
2022

Publication Types

Select...
3

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
references
References 6 publications
0
0
0
Order By: Relevance

Study of critical load force towards thin plating on pre-plated leadframe

Wang
1
,
Ong
2
,
Wang
3
et al. 2017
2017 IEEE 19th Electronics Packaging Technology Conference (EPTC)
0
0
0
0
View full textAdd to dashboardCite

Study of critical load force towards thin plating on pre-plated leadframe

Wang
1
,
Ong
2
,
Wang
3
et al. 2017
2017 IEEE 19th Electronics Packaging Technology Conference (EPTC)
0
0
0
0
View full textAdd to dashboardCite

Suitable Cu Leadframe Material and Design to Achieve High Reliability Requirement and Good Manufacturability

Li1,
Zhang2,
Descartin3
et al. 2018
2018 IEEE 20th Electronics Packaging Technology Conference (EPTC)
2
0
1
0
View full textAdd to dashboardCite

Thermo-Mechanical Modeling to Analyze Package Stress of QFN Package

Rosazlan
1
2022
2022 IEEE 39th International Electronics Manufacturing Technology Conference (IEMT)
1
0
0
0
View full textAdd to dashboardCite
scite logo

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

customersupport@researchsolutions.com

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

Product
Browser ExtensionAssistant by sciteCitation Statement SearchReference CheckVisualizationsDashboardsExplore JournalsExplore OrganizationsExplore FundersEmbedding BadgeEmbedding Citation SearchPricing
Resources
BlogHelp & FAQAccessibility StatementAPI TermsFor Universities & GovernmentsFor ResearchersFor PublishersFor Corporate, Pharma & EnterpriseAuthor MarketingBecome an AffiliateGet an organization trial or quotescite Data & Services
About
News & PressCareersRead our PaperCoverage

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

BlogTerms and ConditionsAPI TermsPrivacy PolicyContactCookie PreferencesDo Not Sell or Share My Personal Information

Copyright © 2024 scite LLC. All rights reserved.

Made with 💙 for researchers

Part of the Research Solutions Family.