Impact of multiple-detect test patterns on product quality

Benware, B.; Schuermyer, C.; Tamarapalli, Nagesh; Tsai, Kun-Han; Ranganathan, S.; Madge, R.; Rajski, J.; Krishnamurthy, P.

doi:10.1109/test.2003.1271091

Cited by 136 publications

(47 citation statements)

References 10 publications

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“…Note that, by using two weights wo(i,0) and wo(i,1) for each output i we enforce the selection of test vectors which provide high deviation values for both fault free responses 0 and 1 at this output since we control the number of vectors which provide high deviation value for each response separately. We verified experimentally that a value of F 2 in the range [2,10] is sufficient to guarantee the selection of test vectors which provide high deviation values at all outputs. We have chosen the value of F 2 = 8 in the experiments reported in Section 4.…”

Section: Proposed Test-generation Methodsmentioning

confidence: 79%

Generation of compact test sets with high defect coverage

Kavousianos

Chakrabarty

2009

2009 Design, Automation &Amp; Test in Europe Conference &Amp; Exhibition

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Abstract-Multi-detect (N-detect) testing suffers from the drawback that its test length grows linearly with N. We present a new method to generate compact test sets that provide high defect coverage. The proposed technique makes judicious use of a new pattern-quality metric based on the concept of output deviations. We select the most effective patterns from a large N-detect pattern repository, and guarantee a small test set as well as complete stuck-at coverage. Simulation results for benchmark circuits show that with a compact, 1-detect stuck-at test set, the proposed method provides considerably higher transition-fault coverage and coverage ramp-up compared to another recently-published method. Moreover, in all cases, the proposed method either outperforms or is as effective as the competing approach in terms of bridging-fault coverage and the surrogate BCE+ metric. In many cases, higher transition-fault coverage is obtained than much larger N-detect test sets for several values of N. Finally, our results provide the insight that, instead of using N-detect testing with as large N as possible, it is more efficient to combine the output deviations metric with multi-detect testing to get highquality, compact test sets.

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Section: Proposed Test-generation Methodsmentioning

confidence: 79%

Generation of compact test sets with high defect coverage

Kavousianos

Chakrabarty

2009

2009 Design, Automation &Amp; Test in Europe Conference &Amp; Exhibition

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“…Under column Time (sec) the run times for the different methods are shown. Next, under column BCE the bridge coverage estimates, computed as in [2], are shown for some test generation methods. In Table 1, the abbreviation SDA refers to the single detections method, EDA refers to the extra detections method, SC is for static test compaction of [11] used on tests obtained using method EDA, LB is the highest known lower bounds on the test set sizes from [6], MT is the method in [6] and CT is the method in [8].…”

Section: Resultsmentioning

confidence: 99%

“…Bridge coverage estimate was proposed in [2] as a measure of detection of unmodeled defects. From the last three columns of Table 1 we note that the BCE for tests generated using EDA is higher than that of the tests generated using SDA even though the test set sizes of EDA are smaller.…”

Section: Results On Iscas Circuitsmentioning

confidence: 99%

A scalable method for the generation of small test sets

Remersaro

Rajski

Reddy

et al. 2009

2009 Design, Automation &Amp; Test in Europe Conference &Amp; Exhibition

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This paper presents a scalable method to generate close to minimal size test pattern sets for stuck-at faults in scan based circuits. The method creates sets of potentially compatible faults based on necessary assignments. It guides the justification and propagation decisions to create patterns that will accommodate most targeted faults. The technique presented achieves close to minimal test pattern sets for ISCAS circuits. For industrial circuits it achieves much smaller test pattern sets than other methods in designs sensitive to decision order used in ATPG.

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“…In [16], multiple-detect test pattern sets are used to improve the quality of tests by maximizing the probability of detecting bridging defects but generates high pattern count compared to a single detect pattern set. To enhance the effectiveness of screening frequency dependent defects, the authors in [17] propose a pattern selection methodology to reduce the delay variation of the selected pattern set and higher frequency is used for pattern application.…”

Section: Related Prior Workmentioning

confidence: 99%