2009
DOI: 10.1016/j.ijleo.2007.09.009
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Impact of polarized illumination on high NA imaging in ArF immersion lithography at 45 nm node

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Cited by 3 publications
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“…The reason is the evanescent waves that carry the object's subwavelength information decay exponentially in a medium with positive permittivity and permeability, and thus could not contribute to the imaging. In order to improve the resolution, various technologies have been exploited, such as reducing the light wavelength by employing deep or even extreme ultraviolet light sources, improving numerical aperture by utilizing immersion lenses with high index materials . This inevitably requires complex projecting optics and control methods, not being affordable for common researchers.…”
Section: Introductionmentioning
confidence: 99%
“…The reason is the evanescent waves that carry the object's subwavelength information decay exponentially in a medium with positive permittivity and permeability, and thus could not contribute to the imaging. In order to improve the resolution, various technologies have been exploited, such as reducing the light wavelength by employing deep or even extreme ultraviolet light sources, improving numerical aperture by utilizing immersion lenses with high index materials . This inevitably requires complex projecting optics and control methods, not being affordable for common researchers.…”
Section: Introductionmentioning
confidence: 99%