Sulfonated aromatic hydrocarbon-based ionomers are potential
constituents
of next-generation polymer electrolyte fuel cells (PEFCs). Widespread
application is currently limited due to their susceptibility to radical-initiated
oxidative degradation that, among other intermediates, involves the
formation of highly reactive aromatic cation radicals. The intermediates
undergo chain cleavage (dealkylation/dearylation) and the loss of
protogenic sulfonate groups, all leading to performance loss and eventual
membrane failure. Laser flash photolysis experiments indicated that
cation radicals can also be formed via direct electron
ejection. We aim to establish the major degradation pathway of proton-exchange
membranes (PEMs). To this end, we irradiated aqueous solutions of
phenyl sulfonate-type model compounds with a Xe arc lamp, thus generating
radicals. The radicals were trapped by 5,5-dimethyl-1-pyrroline N-oxide (DMPO), and the formed adducts were observed by
electron paramagnetic resonance (EPR). The formed DMPO spin adducts
were assigned and relative adduct concentrations were quantified by
simulation of the experimental EPR spectra. Through the formation
of the DMPO/•SO3
– adduct,
we established that desulfonation dominates for monoaromatic phenyl
sulfonates. We observed that diaryl ether sulfonates readily undergo
homolytic C–O scission that produces DMPO/•aryl adducts. Our results support the notion that polyphenylene sulfonates
are the most stable against oxidative attack and effectively transfer
electrons from DMPO, forming DMPO/•OH. Our findings
help to identify durable moieties that can be used as building blocks
in the development of next-generation PEMs.