Impedance Spectra of As-Grown and Heat Treated Na0.5Bi0.5TiO3 Crystals

Kruzina, T. V.; Sidak, V. M.; Trubitsyn, M. P.; Попов, С. А.; Tuluk, Anton; Suchanicz, J.

doi:10.12693/aphyspola.133.816

Cited by 6 publications

(2 citation statements)

References 8 publications

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“…2 can be caused by the increase of structure defects after a thermal treatment. In accordance with [2,4,5] the conduction in NBT is determined by oxygen vacancies and associated with V O defects. Therefore, it may be assumed that evaporation of bismuth during the annealing process of NBT thin films leads to the formation of V Bi 3+''' vacancies, which stimulate appearance of V O 2-•• vacancies.…”

Section: Resultsmentioning

confidence: 70%

Effect of thermal treatment on structure and leakage current of Na0.5Bi0.5TiO3 thin films

et al. 2018

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Na0.5Bi0.5TiO thin films were grown on heated to 200°С Pt/TiO2/SiO2/Si substrates by ex-situ method with high-frequency (13.56 MHz) magnetron deposition. Thermal treatment of the films was carried out at 650°С, 700°С and 800°С. X-ray diffraction investigations showed the films were poly-crystalline and contained additional phase. In the films annealed at 700°C two dominating conduction mechanisms were observed: ohmic at the fields Е < 8 kV/cm and Schottky emission in the field range of 30 – 70 kV/cm. It is also observed that the increase of the film annealing temperature to 800°С leads to the increase of leakage currents. It is assumed that high values of the leakage currents were attributed to the presence of both structure defects and additional unknown phase.

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Section: Resultsmentioning

confidence: 70%

Effect of thermal treatment on structure and leakage current of Na0.5Bi0.5TiO3 thin films

et al. 2018

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“…In the range of T 𝑅 , NBT demonstrates high permittivity and specific dielectric dispersion peculiar to relaxor ferroelectrics [8]. Besides, the properties of NBT can be substantially modified by doping and technological treatments [9][10][11][12].…”

Section: Introductionmentioning

confidence: 99%

Dielectric relaxation induced by oxygen vacancies in Na0.5Bi0.5TiO3 ceramics

Sidak¹,

Trubitsyn²,

Panchenko³

2022

Condens. Matter Phys.

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Dielectric permittivity was studied in ceramics of relaxor ferroelectric bismuth-sodium titanate Na0.5Bi0.5TiO3. The measurements were performed on as sintered and heat treated in vacuum samples. The diffuse dielectric anomalies associated with the structural phase transitions were observed in as sintered samples. The intense peak of permittivity (εmax ∼ 104) appeared after heat treating in vacuum. The anomaly of ε(T) was contributed by slow polarization processes (f < 10 kHz) and was non-stable, vanishing on heating in air up to ∼ 800 K. Temperature and frequency dependencies of ε were described by using Cole-Cole model with accounting thermally stimulated decay of the non-stable polarization. It is supposed that the dielectric anomaly is determined by space charge polarization mechanism. Oxygen vacancies VO•• and electrons localized on titanium ions Ti'Ti are assumed to be responsible for the phenomenon observed.

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Dielectric Anomaly and Space Charge Polarization in Single Crystals of Na0.5Bi0.5TiO3 and Na0.5Bi0.5TiO3–BaTiO3

Sidak,

Trubitsyn

2023

Springer Proceedings in Physics

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Impedance Spectra of As-Grown and Heat Treated Na_0.5Bi_0.5TiO₃ Crystals

Cited by 6 publications

References 8 publications

Effect of thermal treatment on structure and leakage current of Na0.5Bi0.5TiO3 thin films

Effect of thermal treatment on structure and leakage current of Na0.5Bi0.5TiO3 thin films

Dielectric relaxation induced by oxygen vacancies in Na0.5Bi0.5TiO3 ceramics

Dielectric Anomaly and Space Charge Polarization in Single Crystals of Na0.5Bi0.5TiO3 and Na0.5Bi0.5TiO3–BaTiO3

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