Flexible
direct conversion X-ray detectors enable a variety of novel applications
in medicine, industry, and science. Hybrid organic–inorganic
perovskite semiconductors containing elements of high atomic number
combine an efficient X-ray absorption with excellent charge transport
properties. Due to their additional cost-effective and low-temperature
processability, perovskite semiconductors represent promising candidates
to be used as active materials in flexible X-ray detectors. Inspired
by the promising results recently reported on X-ray detectors that
are based on either triple cation perovskites or inkjet-printed perovskite
quantum dots, we here investigate flexible inkjet-printed triple cation
perovskite X-ray detectors. The performance of the detectors is evaluated
by the X-ray sensitivity, the dark current, and the X-ray stability.
Exposed to 70 kVp X-ray radiation, reproducible and highly competitive
X-ray sensitivities of up to 59.9 μC/(Gyaircm2) at low operating voltages of 0.1 V are achieved. Furthermore,
a significant dark current reduction is demonstrated in our detectors
by replacing spin-coated poly(3,4-ethylenedioxythiophene)/poly(styrenesulfonate)
(PEDOT:PSS) with sputtered NiO
x
hole transport
layers. Finally, stable operation of a flexible X-ray detector for
a cumulative X-ray exposure of 4 Gyair is presented, and
the applicability of our devices as X-ray imaging detectors is shown.
The results of this study represent a proof of concept toward flexible
direct conversion X-ray detectors realized by cost-effective and high-throughput
digital inkjet printing.