Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99)
DOI: 10.1109/dftvs.1999.802894
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Implementing a self-checking neural system for photon event identification by SRAM-based FPGAs

Abstract: The paper presents and evaluates the design and the implementation of a self-checking neural system for photon event identification in Intensified Charge-Coupled Devices detectors. The neural approach reveals more effective than classical algorithmic approaches thanks to its learning through example ability. Implementation is accomplished by SRAM-based FPGAs, which have generated increasing interest in the space community. The adoption of suitable on-line fault detection techniques is illustrated taking into a… Show more

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