2023 IEEE 29th International Symposium for Design and Technology in Electronic Packaging (SIITME) 2023
DOI: 10.1109/siitme59799.2023.10430652
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Improved Flying Probe-Inspired In-Circuit Tester for Practical Laboratory Activities

Raul Rotar,
Sorin Liviu Jurj,
Noemi-Clara Rohatinovici
et al.
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