“…Machine-learning techniques trained to detect artifacts in EEG data can address the aforementioned issues, by providing an objective standard for artifact marking, and speeding up the marking process. The most common machine-leaning techniques used for artifact detection in EEG data, are based on support vector machines (SVMs) (Shao et al, 2008;Barua and Begum, 2014;Sai et al, 2017), k-nearest neighbor classifiers (k-NN) (Barua and Begum, 2014;Roy, 2019), independent component analysis (ICA) (Barua and Begum, 2014;Radüntz et al, 2015;Sai et al, 2017), and, as of recently, various deeplearning models [e.g., autoencoders (Yang et al, 2016(Yang et al, , 2018Roy et al, 2019), convolutional neural networks (CNNs) (Roy et al, 2019;Sun et al, 2020;Diachenko et al, 2022;Jurczak et al, 2022), and recurrent neural networks (RNNs) (Roy et al, 2019;Liu et al, 2022)]. Deep-learning solutions, in particular, have increased in popularity for artifact handling (Roy et al, 2019) due to the minimal preprocessing they require and because of their ability to learn very complex functions between input data and the desired output classification (LeCun et al, 2015).…”