2017
DOI: 10.1016/j.solmat.2016.12.012
|View full text |Cite
|
Sign up to set email alerts
|

Improved metal adhesion with galvanic nickel plating to silicon solar cells

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
3
0

Year Published

2018
2018
2019
2019

Publication Types

Select...
6

Relationship

1
5

Authors

Journals

citations
Cited by 10 publications
(3 citation statements)
references
References 36 publications
0
3
0
Order By: Relevance
“…Annealing after plating causes a significant drop in the resistance values on contacts with interface oxide. Thus, after postplating annealing, the influence of the interface oxide on the series resistance of solar cells is attenuated [23].…”
Section: A Postplating Annealing Significantly Decreases the Contact ...mentioning
confidence: 99%
“…Annealing after plating causes a significant drop in the resistance values on contacts with interface oxide. Thus, after postplating annealing, the influence of the interface oxide on the series resistance of solar cells is attenuated [23].…”
Section: A Postplating Annealing Significantly Decreases the Contact ...mentioning
confidence: 99%
“…The process uniformity may have been assisted by the heavily‐doped n + surface to which the Ni was plated. This permitted a long sintering duration that would be expected to effectively reduce any surface oxides which may have formed at the Si interface during the electroless Ni plating process . Consequently, a uniform Ni silicide most likely formed across the entire contact surface and increased contact adhesion …”
Section: Challenges For Copper‐plated Silicon Solar Cellsmentioning
confidence: 99%
“…No significant surface roughening on the sub‐micrometer‐scale is detected on the ns‐pulse laser openings and other passivation layer ablation configuration that cause a melting of the underlying silicon crystal and a smooth surface after recrystallization . But, there are several ways of realizing adhesion of plated contacts on passivation layer openings that were created by ns‐pulsed or cw lasers: silicidation of the nickel–silicon interface, roughening the silicon surface before metal deposition or using plating bath chemistry that roughens the surface during metal deposition . Formation of silicide may cause local shunting or requires two‐step nickel plating with interim anneal .…”
Section: Introductionmentioning
confidence: 99%