2010
DOI: 10.1002/pssc.200983496
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Improved MOCVD growth of GaN on Si‐on‐porous‐silicon substrates

Abstract: The mechanism of the poor surface morphology of MOCVD‐grown GaN on porous Si (PSi) substrates was explored. Transmission electron microscopy suggests that a vacancy growth of pores starts, which is accompanied by the migration of the top surface of the PSi layer during the initial growth stage of GaN on the AlN inter layer. This causes a lot of pits on top GaN and wavy interface between GaN of the PSi layer, deteriorating the poor surface morphology. The epitaxial Si layer on PSi is effective in suppressing th… Show more

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Cited by 14 publications
(4 citation statements)
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“…Thus, it is highly probable that the sintering of the PS layer brings in this case much more flexibility to the system. This allows a more efficient stress/strain sharing between the epilayer and the thin regrown Si film and then a reduced stress/strain in the epilayer contrary to the GaN on Si . On the other hand, due to the reduced stiffness PS, the GaN/AlN/Si stack is more likely to bow.…”
Section: Resultsmentioning
confidence: 99%
“…Thus, it is highly probable that the sintering of the PS layer brings in this case much more flexibility to the system. This allows a more efficient stress/strain sharing between the epilayer and the thin regrown Si film and then a reduced stress/strain in the epilayer contrary to the GaN on Si . On the other hand, due to the reduced stiffness PS, the GaN/AlN/Si stack is more likely to bow.…”
Section: Resultsmentioning
confidence: 99%
“…While discussing the efficiency of the use of hybrid substrates instead of singlecrystalline ones, it should be noted that the known attempts at growth on hybrid substrates, including those with porous layers, have repeatedly shown the prospects of such an approach to the formation of the integrated A III B V /Si nano-heterostructures [45][46][47][48]. Structuring of the hybrid compliant substrate as well as the growth of nanoscale layers with nanocolumnar morphology propose some additional advantages for the integration.…”
Section: Discussionmentioning
confidence: 99%
“…As noted above, the growth of gallium nitride layers on porous silicon has been achieved previously in a number of works, including our own. Nitride films were grown at various temperatures on porous silicon substrates via gas-phase epitaxy from organometallic compounds [48,49], molecular beam epitaxy [12,16], as well as using an RF magnetron sputtering system [50].…”
Section: Discussionmentioning
confidence: 99%