Improved recursive Green's function formalism for quasi one-dimensional systems with realistic defects

Teichert, Fabian; Zienert, Andreas; Schuster, Jörg; Schreiber, Michael

doi:10.1016/j.jcp.2017.01.024

Cited by 11 publications

(9 citation statements)

References 54 publications

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“…Charge transport properties of modified CNTs are analyzed within the LB formulation of the conductance [30][31][32][33][34] , which is particularly appropriate to study charge motion along a Q1D device channels. At quasi-equilibrium conditions, i.e.…”

Section: B Conductance Calculationsmentioning

confidence: 99%

Unequivocal signatures of the crossover to Anderson localization in realistic models of disordered quasi-one-dimensional materials

et al. 2018

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The only unambiguous known criterion for single-parameter scaling Anderson localization relies on the knowledge of the full conductance statistics. To date, theoretical studies have been restricted to model systems with symmetric scatterers, hence lacking universality. We present an in-depth statistical study of conductance distributions P(g), in disordered 'micrometer-long' carbon nanotubes using first principles simulations. In perfect agreement with the Dorokov-Mello-Pereyra-Kumar scaling equation, the computed P(g) exhibits a non-trivial, non-Gaussian, crossover to Anderson localization which could be directly compared with experiments.

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Section: B Conductance Calculationsmentioning

confidence: 99%

Unequivocal signatures of the crossover to Anderson localization in realistic models of disordered quasi-one-dimensional materials

et al. 2018

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“…For the variation of the conductivity of each MWCNT, there are two possible reasons: first, the CNT quality can scatter due to the on‐chip growth—such that the intrinsic CNT conductance alters. In an earlier study, Teichert et al could demonstrate the strong impact of the number of defects on the CNT conductance. Second, it is likely that the conductance of the CNT‐metal contact can vary—as a function of contact material and processing .…”

Section: Electrical Propertiesmentioning

confidence: 94%

Advanced Characterization Methods for Electrical and Sensoric Components and Devices at the Micro and Nano Scales

Sheremet

Meszmer

Blaudeck

et al. 2019

Physica Status Solidi (a)

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The present study covers the nanoanalysis methods for four key material characteristics: electrical and electronic properties, optical, stress and strain, and chemical composition. With the downsizing of the geometrical dimensions of the electronic, optoelectronic, and electromechanical devices from the micro to the nanoscale and the simultaneous increase in the functionality density, the previous generation of microanalysis methods is no longer sufficient. Therefore, the metrology of materials' properties with nanoscale resolution is a prerequisite in materials' research and development. The article reviews the standard analysis methods and focuses on the advanced methods with a nanoscale spatial resolution based on atomic force microscopy (AFM): current-sensing AFM (CS-AFM), Kelvin probe force microscopy (KPFM), and hybrid optical techniques coupled with AFM including tip-enhanced Raman spectroscopy (TERS), photothermal-induced resonance (PTIR) characterization methods (nano-Vis, nano-IR), and photo-induced force microscopy (PIFM). The simultaneous acquisition of multiple parameters (topography, charge and conductivity, stress and strain, and chemical composition) at the nanoscale is a key for exploring new research on structure-property relationships of nanostructured materials, such as carbon nanotubes (CNTs) and nano/microelectromechanical systems (N/MEMS). Advanced nanocharacterization techniques foster the design and development of new functional materials for flexible hybrid and smart applications.

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“…Recursion Green's Function Method : As the system is quite large, the recursion Green's function method was used to obtain the contact conductance of two van der Waals bonded graphene sheets. The advanced Green's function of the conductor region is written as

G_{normalC} = \lim_{η \to 0^{+}} {false[false(E + i η false) I - H_{normalC} - Σ_{normalL} - Σ_{normalR} false]}^{- 1}

where Σ L and Σ R are self‐energies of left and right leads, respectively, and H C represents the Hamiltonian of the conductor region.…”

Section: Methodsmentioning

confidence: 99%

Conductivity Maximum in 3D Graphene Foams

Liu

Wang

Tang

2018

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In conventional foams, electrical properties often play a secondary role. However, this scenario becomes different for 3D graphene foams (GrFs). In fact, one of the motivations for synthesizing 3D GrFs is to inherit the remarkable electrical properties of individual graphene sheets. Despite immense experimental efforts to study and improve the electrical properties of 3D GrFs, lack of theoretical studies and understanding limits further progress. The causes to this embarrassing situation are identified as the multiple freedoms introduced by graphene sheets and multiscale nature of this problem. In this article, combined with transport modeling and coarse-grained molecular dynamic (MD) simulations, a theoretical framework is established to systematically study the electrical conducting properties of 3D GrFs with or without deformation. In particular, through large-scale and massive calculations, a general relation between contact area and conductance for two van der Waals bonded graphene sheets is demonstrated, in terms of which the conductivity maximum phenomenon in GrFs is first theoretically proposed and its competition mechanism is explained. Moreover, the theoretical prediction is consistent with previous experimental observations.

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Improved recursive Green's function formalism for quasi one-dimensional systems with realistic defects

Cited by 11 publications

References 54 publications

Unequivocal signatures of the crossover to Anderson localization in realistic models of disordered quasi-one-dimensional materials

Unequivocal signatures of the crossover to Anderson localization in realistic models of disordered quasi-one-dimensional materials

Advanced Characterization Methods for Electrical and Sensoric Components and Devices at the Micro and Nano Scales

Conductivity Maximum in 3D Graphene Foams

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