2023
DOI: 10.1039/d3cp03106c
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Improved resistive switching performance and realized electric control of exchange bias in a NiO/HfO2 bilayer structure

Yu Lu,
Yuan Yuan,
Ruobai Liu
et al.

Abstract: The fluctuation of switching parameters is unavoidable in the conductive filaments (CFs)-type resistive switching (RS) devices, which restricts the application in resistive random-access memory. Here, we employed an uninsulated antiferromagnetic...

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Cited by 2 publications
(2 citation statements)
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“…To realize electric control of |H EB | by changing the resistance state of the device, a Hall cross structure is chosen, which is favorable for characterizing its magnetic and electrical properties by alternatively measuring the anomalous Hall effect (AHE) and resistive switching (RS), respectively. 26 Unlike previous studies whose localized M-H loops can only be measured using a focused Magneto-optic Kerr magnetometer (F-MOKE), 23,27,28 we probe the localized magnetic properties of samples with perpendicular magnetic anisotropy using AHE measurements. This is an improvement for further applications in spintronics devices such as building array structures and multiple-layer stacks.…”
Section: ■ Results and Discussionmentioning
confidence: 99%
“…To realize electric control of |H EB | by changing the resistance state of the device, a Hall cross structure is chosen, which is favorable for characterizing its magnetic and electrical properties by alternatively measuring the anomalous Hall effect (AHE) and resistive switching (RS), respectively. 26 Unlike previous studies whose localized M-H loops can only be measured using a focused Magneto-optic Kerr magnetometer (F-MOKE), 23,27,28 we probe the localized magnetic properties of samples with perpendicular magnetic anisotropy using AHE measurements. This is an improvement for further applications in spintronics devices such as building array structures and multiple-layer stacks.…”
Section: ■ Results and Discussionmentioning
confidence: 99%
“…Over the past decade, the investigation on RS mechanisms has hold dispute. At present, the most widely accepted theory is the conducting filament model where the random growth and disruption of conducting filaments bring about the dispersed RS parameters. , Therefore, a deeper understanding of the RS mechanism is still crucial for enhancing the reliability and stability of the RRAM device.…”
Section: Introductionmentioning
confidence: 99%