Improved-Sensitivity Resonant Electric-Field Probes Based on Planar Spiral Stripline and Rectangular Plate Structure

A Novel Tangential Electric-Field Sensor Based on Electric Dipole and Integrated Balun for the Near-Field Measurement Covering GPS Band

“…The microstrip line is terminated with a broadband 50 Ω load so that the travelling wave propagates along the extension direction of the trace. Unlike the characterizations in [26,28], the tangential electric-field sensor is not directly placed 2 mm above the center of the trace of the microstrip line since the maximum tangential electric field is located at a point that has an offset off the trace. Figure 9 shows the test setup for characterizing the transmission coefficient of the proposed sensor.…”

“…An open-ended monopole can be employed to pick up the normal electric field [12,13,14,15], while the electrically small electric dipole is utilized to detect the tangential electric field [16,17,18] over a surface above the planar circuit. The electromagnetic sensors can effectively sense electromagnetic fields so that there has been increasing attention given to developing high-performance electric-/magnetic-field sensors, such as extending the bandwidth [19,20,21], improving the spatial resolution [22,23,24] and enhancing the sensitivity [25,26,27,28]. Nowadays, there exists a situation where the reconstruction of the interference source based on the dipole moments needs to detect the tangential electric field [29,30].…”

De‐embedding calibration for an electromagnetic dual probe using GCPW

“…Near‐field measurement 1–8 are widely applied to electromagnetic (EM) interference analysis, 9–11 reconstruction of equivalent emission sources, 12,13 faults location, 13,14 shielding analysis, 15 radio frequency (RF) current and voltage measurement, 16,17 and so forth. The near‐field probe is a key tool for near‐field measurement, so the design and characterization of the probe are essential for the above applications 1–3,18–28 …”

“…The near-field probe is a key tool for near-field measurement, so the design and characterization of the probe are essential for the above applications. [1][2][3][18][19][20][21][22][23][24][25][26][27][28] The dual probe, which can detect the electric field (E-field) and magnetic field (H-field) simultaneously at the same location, 25,29,30 has the advantages of high efficiency in near-field scanning, and has less influence on the measured signals than that of the shielded loop probe. These advantages make the dual probe very suitable for…”

Design and characterisation of a dual probe with double‐loop structure for simultaneous near‐field measurement

“…There are many techniques that can be used to design the near-field probe. The loop antenna is used as a near-field probe [1][2][3], coaxial cable is used to design the near-field probe [4][5][6][7][8], the near-field probe with shield loop is manufactured by printed circuit board (PCB) technology [9][10][11][12], low temperature co-fired ceramic (LTCC) technology is used to design the high performance near-field probe [13,14] and the Thin-film technique is used to design the high spatial resolution near-field probe [15]. Nowadays, near-field probes have been widely used in electromagnetic interference (EMI) detection of large-scale integrated circuits (IC) [16][17][18][19], EMI source location of high-speed PCB [20][21][22][23], near-field electromagnetic shielding characteristic analysis of materials, cryptographic chip electromagnetic security analysis [24] and fault diagnosis of circuit structures [25].…”