2002
DOI: 10.1109/ted.2002.801248
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Improved string ribbon silicon solar cell performance by rapid thermal firing of screen-printed contacts

Abstract: Al-enhanced SiN-induced hydrogenation is implemented to improve the minority carrier lifetime in String Ribbon Si. Rapid cooling after the hydrogenation anneal is found to increase the spatially averaged relative lifetime enhancement by over 160% for String Ribbon Si samples with a spatially averaged as-grown lifetime of 2.9 s. Partial coverage of back surface by Al eliminates wafer bowing in 100 m thick substrates, but reduces the spatially averaged lifetime enhancement to below 100% because vacancy generatio… Show more

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Cited by 17 publications
(7 citation statements)
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“…5 In the past, high-efficiency screen-printed silicon ribbon solar cells have been achieved by optimizing rapid thermal processing ͑RTP͒ to improve the plasma-enhanced chemical vapor deposited SiN x -induced hydrogenation of bulk defects and quality of the Al-doped back surface field ͑Al-BSF͒. 6,7 Recently, record high efficiency EFG ͑16.7%͒ and string ribbon ͑17.7%͒ cells were reported by Hahn and Geiger 8 using photolithography for front contacts, thermal oxidation for front surface passivation, Al gettering for 30 min, ZnS/MgF 2 for double layer antireflection coating, and 60 min. microwave-induced remote hydrogen plasma for defect passivation.…”
mentioning
confidence: 99%
“…5 In the past, high-efficiency screen-printed silicon ribbon solar cells have been achieved by optimizing rapid thermal processing ͑RTP͒ to improve the plasma-enhanced chemical vapor deposited SiN x -induced hydrogenation of bulk defects and quality of the Al-doped back surface field ͑Al-BSF͒. 6,7 Recently, record high efficiency EFG ͑16.7%͒ and string ribbon ͑17.7%͒ cells were reported by Hahn and Geiger 8 using photolithography for front contacts, thermal oxidation for front surface passivation, Al gettering for 30 min, ZnS/MgF 2 for double layer antireflection coating, and 60 min. microwave-induced remote hydrogen plasma for defect passivation.…”
mentioning
confidence: 99%
“…The most easily observable experiment in which a varying f n can be detected is through photoconductance measurements of multicrystalline silicon. 4,[16][17][18][19] In some cases, eff app ͑⌬n app ͒ deviates so greatly from eff ͑⌬n͒ that it prevents any room-temperature assessment of recombination. Dubbed photoconductance "trapping," this artifact, which manifests as a sharp rise in eff app ͑⌬n app ͒ with decreasing ⌬n app , cannot be explained with a single defect but requires the existence of two defects: a "recombination" defect and a trapping defect.…”
Section: F Deviation In Apparent From Actual Lifetime For Two Defectsmentioning
confidence: 99%
“…Experiments using rapid thermal processing (RTP) in combination with PECVD SiN x layers revealed that higher lifetimes can be achieved by using fast cool-down ramps [78,79].…”
Section: Hydrogenation In Ribbon Siliconmentioning
confidence: 99%