This paper shows the application of simple dc techniques to the temperature-dependent characterization of AlGaN/ GaN HEMTs in terms of the following: 1) thermal resistance and 2) ohmic series resistance (at low drain bias). Despite their simplicity, these measurement techniques are shown to give valuable information about the device behavior over a wide range of ambient/channel temperatures. The experimental results are validated by comparison with independent measurements and numerical simulations.Index Terms-Gallium compounds, microwave power transistors, MODFETs, power HEMTs, semiconductor-device measurements, semiconductor-device thermal factors, wide bandgap semiconductors, III nitrides, III-V semiconductors.