2010
DOI: 10.1107/s0909049510024908
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Improved tomographic reconstructions using adaptive time-dependent intensity normalization

Abstract: The first processing step in synchrotron-based micro-tomography is the normalization of the projection images against the background, also referred to as a white field. Owing to time-dependent variations in illumination and defects in detection sensitivity, the white field is different from the projection background. In this case standard normalization methods introduce ring and wave artefacts into the resulting three-dimensional reconstruction. In this paper the authors propose a new adaptive technique accoun… Show more

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Cited by 39 publications
(31 citation statements)
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“…The image time series was reconstructed using a filtered back-projection algorithm (Titarenko et al 2010). The reconstruction centre was found for the first and last image in the sequence and linearly interpolated between these two values for the others.…”
Section: Experimental Protocolmentioning
confidence: 99%
“…The image time series was reconstructed using a filtered back-projection algorithm (Titarenko et al 2010). The reconstruction centre was found for the first and last image in the sequence and linearly interpolated between these two values for the others.…”
Section: Experimental Protocolmentioning
confidence: 99%
“…In the back projection reconstruction of the synchrotron tomographs [30], a combined Fourier-wavelet algorithm [31] was used to suppress ring artefacts (for more details see [31]). These arise from instrument features such as defective pixels in the scintillator; if not adequately supressed they can significantly increase noise in the DVC analysis as they do not displace with the material.…”
Section: Tomographymentioning
confidence: 99%
“…The PCO 4000 camera (with 4008×2672 pixels) imaged a scintillation screen capturing 3001 radiographic projections during a 180° rotation of the sample about the impact axis. A filtered back projection algorithm was used to reconstruct the 3D volume representing X-ray attenuation of the sample with a voxel size of 3.6 μm, allowing visualization of the sample surfaces including internal voids [10]. Figure 2 shows three illustrative sequences and analyses taken from high-speed photography of impacts of PEEK and PTFE.…”
Section: Experiments and Imagingmentioning
confidence: 99%