Improvement and recent applications of the Tohoku microbeam system

Matsuyama, S.; Ishii, K.; Watanabe, Kôji; Terakawa, A.; Kikuchi, Y.; Fujiwara, M.; Sugai, H.; Karahashi, M.; Nozawa, Y.; Yamauchi, Satoshi; Fujisawa, Mariko; Ishiya, M.; Nagaya, T.; Ortega, Richard; Carmona, Asunción; Roudeau, Stéphane

doi:10.1016/j.nimb.2013.06.056

Cited by 16 publications

(6 citation statements)

References 14 publications

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“…8 The measured beam size of the triplet system was ∼ 2×1 μm 2 , which is larger than the calculated beam size as well as that obtained using the existing doublet system. Calculations show that effects of spherical aberration represent the largest component of beam broadening.…”

Section: Introductionmentioning

confidence: 53%

“…Details of the design of the system, together with preliminary results, are described in Ref. 8. The beam properties were calculated using the ray-tracing software package "WinTRAX".…”

Section: Microbeam Systemmentioning

confidence: 99%

“…Furthermore, of these aberrations are more significant with the triplet system than the doublet system. 8 With the triplet system, the demagnification factor increased by a factor of 1.5-2.5 compared with the doublet system. However, the chromatic aberration increased by a factor of 4-8 and the spherical aberration increased by a factor of more than 10.…”

Section: Introductionmentioning

confidence: 95%

“…Calculations show that effects of spherical aberration represent the largest component of beam broadening. 8 Moreover, chromatic aberration also appears to affect the beam size. Furthermore, of these aberrations are more significant with the triplet system than the doublet system.…”

Section: Introductionmentioning

confidence: 99%

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Improvement of ion beam brightness by reducing voltage ripple of an electrostatic accelerator for microbeam focusing by a triplet quadrupole lens system having large spherical aberration coefficient

et al. 2013

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The microbeam system at Tohoku University was upgraded to a triplet lens system aiming at applying to the analysis of sub-micron features. The triplet lens system has a higher demagnification than the existing doublet system. However, the introduction of the triplet system also resulted in larger chromatic and spherical aberration coefficients.To overcome these problems, the energy resolution of the accelerator was improved by developing a terminal voltage stabilization system. The energy resolution of the accelerator was improved to 1 × 10 −5 ΔE/E, which resulted in an increase in the brightness of the beam. The beam brightness was 2.3 pA · µm −2 · mrad −2 · MeV −1 and was higher in the central region. The effects of the increased chromatic and spherical aberration were mitigated by restricting the divergence angle without reducing the beam current. A beam spot size of 0.6 × 0.8 µm 2 was obtained with a beam current of 150 pA.

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Section: Introductionmentioning

confidence: 53%

“…Details of the design of the system, together with preliminary results, are described in Ref. 8. The beam properties were calculated using the ray-tracing software package "WinTRAX".…”

Section: Microbeam Systemmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 95%

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Improvement of ion beam brightness by reducing voltage ripple of an electrostatic accelerator for microbeam focusing by a triplet quadrupole lens system having large spherical aberration coefficient

et al. 2013

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“…(10) Among the various scintillators, silver-activated zinc sulfide (ZnS:Ag) is quite popular for convenient α-particle or ionized particle beam monitoring. (11)(12)(13) The form of the powdered structure of ZnS:Ag is also beneficial for ionized particle detection because of its high sensitivity to primary particles distinct from the background. (14) Much effort is continuously made in the development of various scintillators with properties superior to those of ZnS:Ag.…”

Section: Introductionmentioning

confidence: 99%

Ion-Beam-Induced Luminescence Analysis of β-SiAlON:Eu Scintillator under Focused Microbeam Irradiation

2016

Sensors and Materials

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The scintillation properties and radiation durability of β-SiAlON:Eu were evaluated under focused microbeam irradiation conditions using 3 MeV protons. In situ observation of scintillation from β-SiAlON:Eu was monitored using ion-beam-induced luminescence (IBIL) and compared with that from ZnS:Ag scintillators. A comparison of the spectra of IBIL from both scintillators shows that the intensity of IBIL was analogous at different peak wavelengths of 545 nm for β-SiAlON:Eu and 450 nm for ZnS:Ag under the same irradiation conditions. Better radiation hardness towards focused proton microbeam irradiation was observed for the β-SiAlON:Eu scintillator when continuous measurements by IBIL were used. A decay constant of approximately 1.11 × 10 16 , which is two orders of magnitude higher than that for ZnS:Ag, was obtained for the β-SiAlON:Eu scintillator for focused proton microbeam irradiation. IBIL was also capable of visualizing a previously damaged area of a ZnS:Ag scintillator, which corresponds to the focused beam scanning area of 100 × 100 μm 2 . Meanwhile, the irradiated region was not significantly distinguishable from the nonirradiated region on the β-SiAlON:Eu scintillator under the same beam fluence. These results suggest that β-SiAlON:Eu could be an ideal candidate scintillator for convenient ionized particle beam monitoring and a diagnostic tool for focused and intense beam fluence conditions up to 10 16 ions/cm2.

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Development of N,N,N′,N′-tetra-2-ethylhexyl-thiodiglycolamide silica-based adsorbent to separate useful metals from simulated high-level liquid waste

Osawa

Kubota

et al. 2022

Journal of Chromatography A

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Improvement and recent applications of the Tohoku microbeam system

Cited by 16 publications

References 14 publications

Improvement of ion beam brightness by reducing voltage ripple of an electrostatic accelerator for microbeam focusing by a triplet quadrupole lens system having large spherical aberration coefficient

Improvement of ion beam brightness by reducing voltage ripple of an electrostatic accelerator for microbeam focusing by a triplet quadrupole lens system having large spherical aberration coefficient

Ion-Beam-Induced Luminescence Analysis of β-SiAlON:Eu Scintillator under Focused Microbeam Irradiation

Development of N,N,N′,N′-tetra-2-ethylhexyl-thiodiglycolamide silica-based adsorbent to separate useful metals from simulated high-level liquid waste

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