2006
DOI: 10.1143/jjap.45.l105
|View full text |Cite
|
Sign up to set email alerts
|

Improvement of Critical Current Density Uniformity for Interface-Modified Josephson Junctions in Single Flux Quantum Circuits

Abstract: We present the results of ab initio electronic structure calculations for the adsorption characteristics of three amine molecules on Au(111), which show that the inclusion of van der Waals interactions between the isolated molecule and the surface leads in general to good agreement with experimental data on the binding energies. Each molecule, however, adsorbs with a small tilt angle (between −5 and 9 • ). For the specific case of 1,4-diaminobenzene (BDA) our calculations reproduce the larger tilt angle (close… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
3
0

Year Published

2007
2007
2024
2024

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 14 publications
(3 citation statements)
references
References 18 publications
0
3
0
Order By: Relevance
“…19 shows a compact sampling oscilloscope installed the HTS sampler circuit chip in a compact cooling unit [17]. Waveform (50 GHz) was observed by using this oscilloscope, but its potential bandwidth over 100 GHz was confirmed in on-chip sampler experiments [18].…”
Section: Hts Sfq Device Technologymentioning
confidence: 97%
“…19 shows a compact sampling oscilloscope installed the HTS sampler circuit chip in a compact cooling unit [17]. Waveform (50 GHz) was observed by using this oscilloscope, but its potential bandwidth over 100 GHz was confirmed in on-chip sampler experiments [18].…”
Section: Hts Sfq Device Technologymentioning
confidence: 97%
“…It is likely that the variations would influence characteristics of interface-modified junctions. We have recently found that the junction value actually depends on the size of base-electrode [14]. In this paper, we describe the dependence of the critical current density for interface-modified junctions on base-electrode size and contact-hole area in detail.…”
Section: Introductionmentioning
confidence: 93%
“…Investigation of the for individual JJs in a T-FF test circuit schematically shown in Fig. 6(a) revealed that the JJs on the small BE pattern of the T-FF cell have values approximately twice as large as those for the JJs of the JTLs, which is considered to result from a slight difference in the surface temperature during the CE deposition [34]. Considering the dependence of on the BE pattern size, we proposed the separated base-electrode layout (SBL) method, in which separated BE patterns with almost the same size are employed, as shown in Fig.…”
Section: B Circuit Design and Operationmentioning
confidence: 99%