2020
DOI: 10.1016/j.jmst.2019.08.027
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Improvement of elevated-temperature strength and recrystallization resistance via Mn-containing dispersoid strengthening in Al-Mg-Si 6082 alloys

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Cited by 63 publications
(16 citation statements)
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“…By contrast, homogenization at a higher temperature before extrusion negatively impacts the dispersoid size and number density [ 8 , 13 , 16 ]. For instance, although extruded at 350 °C, the dispersoids formed during high-temperature homogenization (550 °C/5 h) in 0.5Mn(HL) featured a much larger and lower after extrusion compared to the dispersoids formed during low-temperature homogenization (400 °C/5 h) in 0.5Mn(LL), as shown in Table 2 .…”
Section: Resultsmentioning
confidence: 99%
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“…By contrast, homogenization at a higher temperature before extrusion negatively impacts the dispersoid size and number density [ 8 , 13 , 16 ]. For instance, although extruded at 350 °C, the dispersoids formed during high-temperature homogenization (550 °C/5 h) in 0.5Mn(HL) featured a much larger and lower after extrusion compared to the dispersoids formed during low-temperature homogenization (400 °C/5 h) in 0.5Mn(LL), as shown in Table 2 .…”
Section: Resultsmentioning
confidence: 99%
“…Apparently, the very coarse dispersoids in 0.5Mn(HL) ( Table 2 ) were incapable of retarding SRX. By contrast, both 0.5Mn(LL) and 1Mn(LL) remained resistant to SRX at 540 °C, and the microstructures under both conditions were still deformed recovery structures ( Figure 3 c,d) owing to the higher Zener pinning effect caused by the fine and densely distributed dispersoids [ 13 , 16 ]. In addition, compared with the grain structure in 0.5Mn(LH) ( Figure 2 a), the 0.5Mn(LL) after solution treatment ( Figure 3 c) still had a higher density of dislocations and LAGBs.…”
Section: Resultsmentioning
confidence: 99%
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