“…Measurement of film thickness and surface observations were performed using a stainless steel substrate because it was difficult for the PET substrate to be fixed accurately and flat on a stage for high magnification observations. However, we compared the OTR of the SiO x N y /PET sample and the oxidation behavior of the SiO x N y /stainless steel sample in our previous work and confirmed that they showed good agreement [24]. A Fourier-transform infrared spectroscope (Nicolet 380, Thermo ELECTRON Corp., Japan) was used to analyze the chemical bonds of the SiO x N y films.…”