Improvement of thermally induced current bifurcation in VCSEL arrays with non-uniform series resistance design

Abstract

Non-uniform series resistance design of VCSEL arrays is studied to improve thermally induced current bifurcation based on an electro-opto-thermal model of VCSEL arrays. Taking an 850nm VCSEL array with 4×4 cells for example, the impact of series resistance on current bifurcation is investigated. Increasmg series resistance is helpful to enhance the critical current values of current bifurcation point (Irc) and hence delay the current bifurcation phenomenon. For VCSEL array with non-uniform series resistance, Irc is increased by 28.6% and the total output optical power is enhanced by 14.3% when compared with that of VCSEL array with uniform series resistance. Therefore, non-uniform series resistance design is a better method for delaying the current bifurcation phenomenon and enhancuig the output optical power of VCSEL arrays.