Improvements on the measurements of dielectric constant and dissipation factor in a wide frequency range

Kakimoto, Akira; Ogawa, Ichizo; Matsushita, T.

doi:10.1063/1.1134946

Cited by 13 publications

(3 citation statements)

References 8 publications

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“…4 Another significant difference of the present method from the conventional ones is that what is required for the measurements is not the absolute values of length or voltage but the ratio of lengths or that of voltages. 4 Another significant difference of the present method from the conventional ones is that what is required for the measurements is not the absolute values of length or voltage but the ratio of lengths or that of voltages.…”

Section: S Smentioning

confidence: 98%

Measurements of high-frequency dielectric properties of liquids by the solid plate displacement method

Kakimoto

Ogawa

1981

Review of Scientific Instruments

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Articles you may be interested inLaser-ultrasonic methods for thin-film property measurements using high-frequency surface acoustic waves AIP Conf. Quantum chaos methods applied to highfrequency plate vibrationsThis paper describes a rapid precise method for measurements of the dielectric constant and dissipation factor of liquid specimens in a wide frequency range. Using a two-terminal micrometer-controlled electrode system with a conventional Q meter, a whole measurement of a specimen having a dielectric constant of 2-10 can be done with an accuracy of ±0.2%-O.5% for the dielectric constant and ± 4-11 It rad or ± 10% for the dissipation factor up to the highest frequency of the Q meter. Once the dielectric constant, dissipation factor, and the mean thickness of a reference solid plate are determined, it takes only a few minutes for the measurements regardless of the gap length and area of the electrodes.

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Section: S Smentioning

confidence: 98%

Measurements of high-frequency dielectric properties of liquids by the solid plate displacement method

Kakimoto

Ogawa

1981

Review of Scientific Instruments

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“…These have a frequency range of 1-70 MHz. Kakimoto and his co-workers [23] extended the method to 200 MHz. Specimens are typically discs or rectangles that are larger than electrodes, but developments described by Heidinger [13] enable disc-and ring-shaped specimens that have smaller diameter than electrodes to be measured.…”

Section: Introductionmentioning

confidence: 99%

Low loss dielectric measurements in the frequency range 1–70 MHz by using a vector network analyser

Gregory¹,

Hill²,

Barnett³

2021

Meas. Sci. Technol.

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The resonance of a coil inductor and a parallel-electrode capacitor can be used to determine the permittivity and loss angle of sheets of material at RF frequencies. By using high-stability instrumentation to measure resonant frequency and Q-factor, the loss angle of very low-loss materials can be determined with a resolution of below 10 microradians. In the 1970s much work went into developing Q-meter-based systems, based on series resonance, which were typically used for measuring the loss angle of polymers such as polyethylene. These systems were also used for measuring ceramics used as RF windows in prototype fusion reactors. This paper describes how one of these systems was updated to replace the now obsolete Q-meter with a vector network analyser (VNA), using parallel resonance. A second aspect to the work is calculation of the fringing (edge) capacitance between the electrodes, which are unguarded, by using MIT FastCap software. This enables measurements obtained by the equivalent-thickness method to be corrected for the effects of fringing capacitance. Measurements using an unmodified Q-meter system, a VNA-based system, and two other techniques are compared for polyethylene, fused silica, macor and alumina specimens. Good agreement is obtained. The measurements are presented with comprehensive evaluations of uncertainty.

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“…This limitation is a result of our experimental setup being unsuitable for determining the imaginary part through measurement of the resistive component. 10,11 …”

Section: Introductionmentioning

confidence: 99%

Method of measuring dielectric constant using an oscilloscope

Nogi

Watanabe

Suzuki

et al. 2015

American Journal of Physics

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A simple relationship determining the dielectric constant of a material inserted in a parallel-plate capacitor is formulated from Gauss's law for a uniform electric field and the continuity condition of electric flux at the boundary of the material. The relationship suggests that the dielectric constant can be determined from the dependence of the charge stored on the capacitor on the thicknesses of the material and the air layer between the plates. A uniform field is created by applying an ac voltage to the plates, which includes a guard ring. The stored charge is estimated by using an oscilloscope to measure the voltage across a resistor inserted between the power supply and the capacitor. The results of the measurement are given for planar materials such as soda-lime glass, Bakelite, acrylic glass, and Teflon with a thickness of 0.5–1 cm.

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Improvements on the measurements of dielectric constant and dissipation factor in a wide frequency range

Cited by 13 publications

References 8 publications

Measurements of high-frequency dielectric properties of liquids by the solid plate displacement method

Measurements of high-frequency dielectric properties of liquids by the solid plate displacement method

Low loss dielectric measurements in the frequency range 1–70 MHz by using a vector network analyser

Method of measuring dielectric constant using an oscilloscope

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