2019
DOI: 10.1016/j.microrel.2018.12.011
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Improving Instruction TLB Reliability with Efficient Multi-bit Soft Error Protection

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(1 citation statement)
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“…However, the scaling technology makes soft error dominate in the reliable NoCs [12,13,14,15]. Due to the increasing error rate and complex patterns of Multiple-Cell Upsets (MCU), the more and more concern on soft error also have received from the academic and industry [16,17,18,19]. Particularly MCU spoils the typical Error Correction Coding (SECDED, Single Error Correction Double Errors Detection) of Virtual Channels in NoC routers [20].…”
Section: Introductionmentioning
confidence: 99%
“…However, the scaling technology makes soft error dominate in the reliable NoCs [12,13,14,15]. Due to the increasing error rate and complex patterns of Multiple-Cell Upsets (MCU), the more and more concern on soft error also have received from the academic and industry [16,17,18,19]. Particularly MCU spoils the typical Error Correction Coding (SECDED, Single Error Correction Double Errors Detection) of Virtual Channels in NoC routers [20].…”
Section: Introductionmentioning
confidence: 99%