2015 20th IEEE European Test Symposium (ETS) 2015
DOI: 10.1109/ets.2015.7138749
|View full text |Cite
|
Sign up to set email alerts
|

Improving RO-PUF quality on FPGAs by incorporating design-dependent frequency biases

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
4
0

Year Published

2016
2016
2024
2024

Publication Types

Select...
3
2
1
1

Relationship

0
7

Authors

Journals

citations
Cited by 7 publications
(4 citation statements)
references
References 11 publications
0
4
0
Order By: Relevance
“…In [11], the local randomness is distilled by modeling and subtracting the systematic variation. A similar technique is to subtract the averaged frequency from multiple measurements to reveal the true local random variation [12]. However, the calculation and information storage requirement come with the cost of addition latency and hardware.…”
Section: B Techniques To Improve Parametric Puf Qualitymentioning
confidence: 99%
See 1 more Smart Citation
“…In [11], the local randomness is distilled by modeling and subtracting the systematic variation. A similar technique is to subtract the averaged frequency from multiple measurements to reveal the true local random variation [12]. However, the calculation and information storage requirement come with the cost of addition latency and hardware.…”
Section: B Techniques To Improve Parametric Puf Qualitymentioning
confidence: 99%
“…For unstable PUFs, re-sampling the PUF yields a noisy version of the original response as presented in equation (12). When the probability of transition is q, Theorem 1 shows us that it is sufficient to guess the original response x (1) up to Hamming distance m • q.…”
Section: Examples For Quantifying the Security Of Pufsmentioning
confidence: 99%
“…In [16], the systematic variation is modeled and subtracted from the PUF response to distill true randomness with the cost of model calculation. Similarly, in [19], the averaged RO frequency is subtracted from the original frequency, where the multiple measurements of each RO can lead to large latency overhead. In [20], a method is proposed to extract local random process variation from total variation, however, a second order difference calculation is needed, and hard-macro technique must be applied to construct symmetric delay paths.…”
Section: B Systematic Process Variationmentioning
confidence: 99%
“…The authors of [13] and [14] analyze bias in RO PUFs on Altera FPGAs and show that bias is introduced based on the location of the RO on the die, as well as which LUT inputs are used and whether non-PUF-related (payload) activities are occurring. A chip-to-chip performance removal technique is proposed in which the mean frequency of each RO (computed from a sample population of devices) is used to offset the RO frequencies in each device, as a means of improving uniqueness.…”
Section: Introductionmentioning
confidence: 99%