2023
DOI: 10.1021/acs.nanolett.3c02308
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Improving Strain-localized GaSe Single Photon Emitters with Electrical Doping

Weijun Luo,
Alexander Puretzky,
Benjamin Lawrie
et al.

Abstract: Exciton localization through nanoscale strain has been used to create highly efficient single-photon emitters (SPEs) in 2D materials. However, the strong Coulomb interactions between excitons can lead to nonradiative recombination through exciton–exciton annihilation, negatively impacting SPE performance. Here, we investigate the effect of Coulomb interactions on the brightness, single photon purity, and operating temperatures of strain-localized GaSe SPEs by using electrostatic doping. By gating GaSe to the c… Show more

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Cited by 3 publications
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“…[ 16,17,23 ] Toward this end, cathodoluminescence microscopy has been a powerful tool for correlative studies on the nanoscale; [ 24–26 ] however, the characterization of TMDs requires encapsulation with hBN to prevent electron beam‐induced damage and imaging of the stacked heterostructure is challenging due to electron beam‐induced excitation in each layer. [ 27 ] Super‐resolution near‐field microscopy has been used in combination with atomic force microscopy (AFM) to correlate the emission spectra with local strain induced by small nanobubbles with heights up to 20 nm, [ 28,29 ] but these techniques are practically limited to noncryogenic temperatures where SPEs are not visible. [ 30–33 ] Cryogenic studies, on the other hand, have not incorporated nanoscale strain correlations when analyzing SPE properties.…”
Section: Introductionmentioning
confidence: 99%
“…[ 16,17,23 ] Toward this end, cathodoluminescence microscopy has been a powerful tool for correlative studies on the nanoscale; [ 24–26 ] however, the characterization of TMDs requires encapsulation with hBN to prevent electron beam‐induced damage and imaging of the stacked heterostructure is challenging due to electron beam‐induced excitation in each layer. [ 27 ] Super‐resolution near‐field microscopy has been used in combination with atomic force microscopy (AFM) to correlate the emission spectra with local strain induced by small nanobubbles with heights up to 20 nm, [ 28,29 ] but these techniques are practically limited to noncryogenic temperatures where SPEs are not visible. [ 30–33 ] Cryogenic studies, on the other hand, have not incorporated nanoscale strain correlations when analyzing SPE properties.…”
Section: Introductionmentioning
confidence: 99%