Improving tapping mode atomic force microscopy with piezoelectric cantilevers

Rogers, Bill; Manning, M. Lisa; Sulchek, Todd; Adams, Jonathan D.

doi:10.1016/j.ultramic.2004.01.016

Cited by 79 publications

(64 citation statements)

References 59 publications

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“…This probe is made of 1-10 Ωcm Phosphorus doped Si, with a nominal spring constant (k z ) and resonance frequency known to be 3 N/m and 50 kHz respectively 27 . The dimensions were measured to be L cant = 485 µm, L tip = 20 µm, which is in agreement with other previous measurements 28,29 . L cant is the length of the portion of the cantilever between the base of the cantilever and the tip.…”

Section: Methodssupporting

confidence: 91%

Simultaneous measurement of normal and friction forces using a cantilever-based optical interfacial force microscope

Kim

Bonander

Rasmussen

2011

Review of Scientific Instruments

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We measured normal and friction forces simultaneously using a recently developed cantilever-based optical interfacial force microscope technique for studies of interfacial structures and mechanical properties of nanoscale materials. We derived how the forces can be incorporated into the detection signal using the classical Euler equation for beams. A lateral modulation with the amplitude of nanometers was applied to create the friction forces between tip and sample. We demonstrated its capability by measuring normal and friction forces of interfacial water at the molecular scale over all distance ranges.

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Section: Methodssupporting

confidence: 91%

Simultaneous measurement of normal and friction forces using a cantilever-based optical interfacial force microscope

Kim

Bonander

Rasmussen

2011

Review of Scientific Instruments

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“…This probe is made of 1-10 Ωcm Phosphorus doped Si, with a nominal spring constant (k z ) and resonance frequency known to be 3 N/m and 50 kHz, respectively (Bruker Corp., 2011). The dimensions were measured to be L cant = 485 m, L tip = 20 m, which is in agreement with other previous measurements (Rogers et al, 2004;Vázquez et al, 2009). L cant is the length of the portion of the cantilever between the base of the cantilever and the tip.…”

Section: Figure 1(b)supporting

confidence: 89%

Cantilever-Based Optical Interfacial Force Microscopy

Byung¹

2012

Molecular Interactions

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“…Fast X-Y scanners have been developed [14][15][16][17][18]. Novel probe structures with integrated actuators were also designed [19][20][21][22][23][24][25]. Although non-dynamic methods without feedback have been proposed [26,27], these methods may not be suitable for delicate samples.…”

Section: Introductionmentioning

confidence: 99%

High-speed dynamic atomic force microscopy by using a Q-controlled cantilever eigenmode as an actuator

Balantekin

2015

Ultramicroscopy

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Keywords:Atomic force microscope High-speed dynamic AFM Fast actuation Q-controlled eigenmode of a cantilever a b s t r a c tWe present a high-speed operating method with feedback to be used in dynamic atomic force microscope (AFM) systems. In this method we do not use an actuator that has to be employed to move the tip or the sample as in conventional AFM setups. Instead, we utilize a Q-controlled eigenmode of an AFM cantilever to perform the function of the actuator. Simulations show that even with an ordinary tappingmode cantilever, imaging speed can be increased by about 2 orders of magnitude compared to conventional dynamic AFM imaging.

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Improving tapping mode atomic force microscopy with piezoelectric cantilevers

Cited by 79 publications

References 59 publications

Simultaneous measurement of normal and friction forces using a cantilever-based optical interfacial force microscope

Simultaneous measurement of normal and friction forces using a cantilever-based optical interfacial force microscope

Cantilever-Based Optical Interfacial Force Microscopy

High-speed dynamic atomic force microscopy by using a Q-controlled cantilever eigenmode as an actuator

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