Improving the accuracy of alpha particle induced X-ray emission analysis: The role of multiple ionization K X-ray satellites

High resolution energy dispersive spectrometry (HiREDS), a new tool for X-ray emission work

“…[16][17][18] On counting at that date there were a total of 22 laboratories using it for: (a) elemental analysis (24 references); (b) chemical state analysis (44 references) and (c) basic research (46 references). WDS systems still keep a standard rate of publication in these same areas and the more recent studies by Kavčič, 19-21 Kertész, 22 Hasegawa, 23 Maeda, 24 Tada, 25,26 Woo 27 and Cureatz, 28 to point out just a very few, are good examples.…”

Influence of chemical effects on Al high-resolution Kα X-ray spectra in proton and alpha particle induced X-ray spectra

“…59 Several papers reported relative intensities of the α 4 and α 3 satellite peaks in Al and its compounds induced by photons, 51–53 electrons 44,46 and ions. 48,57,60 Cureatz et al 61 recently demonstrated the influence of multiple ionization satellites induced by 3–5 MeV energy He ions on the accuracy of He induced PIXE used with standard SDD energy-dispersive detectors. In that work, a high-resolution wavelength-dispersive spectrometer was used to study the fine structure of Kα X-rays induced by He ions for the range of elements from P to Cr, following the work of Heirwegh et al 58,62 on Mg, Al and Si, including their oxides.…”