Improving the energy resolution of bent crystal X-ray spectrometers with position-sensitive detectors

Honkanen, A.; Verbeni, R.; Simonelli, Laura; Sala, M. Moretti; Al-Zein, Ali; Krisch, M.; Monaco, G.; Huotari, Simo

doi:10.1107/s1600577514011163

Cited by 30 publications

(16 citation statements)

References 20 publications

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“…However, the diffraction properties of spherically bent wafers were poorly understood until the inclusion of in-plane stresses and strains to diffraction calculations in the mid-2010s. As shown in our previous work (Honkanen et al, 2014a(Honkanen et al, ,b, 2016, the in-plane deformation of a thin, elastically anisotropic plate solved via geometrical considerations can accurately explain the experimentally measured reflectivity curves of SBCAs with circularly shaped wafers cut along arbitrary crystal directions. Nevertheless, the original derivation relies on many geometrical features and symmetries which can not be easily generalized to toroidal bending or other types of crystal shapes, such as rectangular ones used, for example, in recently introduced strip-bent analysers designed to minimized the influence of the in-plane stress (Rovezzi et al, 2017).…”

Section: Introductionsupporting

confidence: 67%

General method to calculate the elastic deformation and X-ray diffraction properties of bent crystal wafers

Honkanen

Huotari

2021

IUCrJ

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Toroidally and spherically bent single crystals are widely employed as optical elements in hard X-ray spectrometry at synchrotron and free-electron laser light sources, and in laboratory-scale instruments. To achieve optimal spectrometer performance, a solid theoretical understanding of the diffraction properties of such crystals is essential. In this work, a general method to calculate the internal stress and strain fields of toroidally bent crystals and how to apply it to predict their diffraction properties is presented. Solutions are derived and discussed for circular and rectangular spherically bent wafers due to their prevalence in contemporary instrumentation.

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Section: Introductionsupporting

confidence: 67%

General method to calculate the elastic deformation and X-ray diffraction properties of bent crystal wafers

Honkanen

Huotari

2021

IUCrJ

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“…NRIXS is performed with synchrotron radiation, and it has become feasible at 3rd generation synchrotron radiation facilities and continually more popular owing to developments in the instrumentation 26 27 28 29 . In NRIXS, an X-ray photon scatters inelastically from the sample system and transfers only part of its energy to an excitation of the system.…”

Section: Methodsmentioning

confidence: 99%

X-ray induced dimerization of cinnamic acid: Time-resolved inelastic X-ray scattering study

Inkinen

Niskanen

Talka

et al. 2015

Sci Rep

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A classic example of solid-state topochemical reactions is the ultraviolet-light induced photodimerization of α-trans-cinnamic acid (CA). Here, we report the first observation of an X-ray-induced dimerization of CA and monitor it in situ using nonresonant inelastic X-ray scattering spectroscopy (NRIXS). The time-evolution of the carbon core-electron excitation spectra shows the effects of two X-ray induced reactions: dimerization on a short time-scale and disintegration on a long time-scale. We used spectrum simulations of CA and its dimerization product, α-truxillic acid (TA), to gain insight into the dimerization effects. From the time-resolved spectra, we extracted component spectra and time-dependent weights corresponding to CA and TA. The results suggest that the X-ray induced dimerization proceeds homogeneously in contrast to the dimerization induced by ultraviolet light. We also utilized the ability of NRIXS for direct tomography with chemical-bond contrast to image the spatial progress of the reactions in the sample crystal. Our work paves the way for other time-resolved studies on chemical reactions using inelastic X-ray scattering.

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“…Since the initial original publications by Johann [110], Johansson [111] and von Hamos [112], there have been many publications [5,2,82,94,[100][101][102][113][114][115][116][117][118][119][120][121][122][123][124] discussing and illustrating variations and improvements, though some articles describe setups at large scale facilities such as a free electron laser or synchrotron. This list, however, is just meant to be a starting point for the interested reader with no claim to be complete or exhaustive.…”

Section: Tablementioning

confidence: 99%

Modern X-ray spectroscopy: XAS and XES in the laboratory

Zimmermann

Peredkov

Abdala

et al. 2020

Coordination Chemistry Reviews

162

140

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X-ray spectroscopy is an important tool for scientific analysis. While the earliest demonstration experiments were realised in the laboratory, with the advent of synchrotron light sources most of the experiments shifted to large scale synchrotron facilities. In the recent past there is an increased interest to perform X-ray experiments also with in-house laboratory sources, to simplify access to X-ray absorption and X-ray emission spectroscopy, in particular for routine measurements. Here we summarise the recent developments and comment on the most representative example experiments in the field of in-house laboratory X-ray spectroscopy. We first give an introduction and some historic background on X-ray spectroscopy. This is followed by an overview of the detection techniques used for X-ray absorption and X-ray emission measurements. A short paragraph also puts related high energy resolution and resonant techniques into context, though they are not yet feasible in the laboratory. At the end of this section the opportunities using wavelength dispersive X-ray spectroscopy in the laboratory are discussed. Then we summarise the relevant details of the recent experimental laboratory setups split into two separate sections, one for the recent von Hamos setups, and one for the recent Johann/Johansson type setups. Following that, focussing on chemistry and catalysis, we then summarise some of the notable X-ray absorption and X-ray emission experiments and the results accomplished with in-house setups. In a third part we then discuss some applications of laboratory X-ray spectroscopy with a particular focus on chemistry and catalysis.

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Improving the energy resolution of bent crystal X-ray spectrometers with position-sensitive detectors

Cited by 30 publications

References 20 publications

General method to calculate the elastic deformation and X-ray diffraction properties of bent crystal wafers

General method to calculate the elastic deformation and X-ray diffraction properties of bent crystal wafers

X-ray induced dimerization of cinnamic acid: Time-resolved inelastic X-ray scattering study

Modern X-ray spectroscopy: XAS and XES in the laboratory

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