2021
DOI: 10.1016/j.apsusc.2021.149272
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Improving the homogeneity and quality of InGaN/GaN quantum well exhibiting high In content under low TMIn flow and high pressure growth

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Cited by 8 publications
(2 citation statements)
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“…The incorporation of indium into InGaN is sensitive to several growth conditions, such as temperature, growth rate, flux of sources, pseudo-template characteristic effect, etc. [7,8]. Ammonia is an important gas source in the MOCVD-based growth of GaN-based materials; usually, an increase in the ammonia flow rate is considered to have a positive effect on indium incorporation, because a high V/III ratio is often beneficial to the incorporation of group III atoms [9,10].…”
Section: Introductionmentioning
confidence: 99%
“…The incorporation of indium into InGaN is sensitive to several growth conditions, such as temperature, growth rate, flux of sources, pseudo-template characteristic effect, etc. [7,8]. Ammonia is an important gas source in the MOCVD-based growth of GaN-based materials; usually, an increase in the ammonia flow rate is considered to have a positive effect on indium incorporation, because a high V/III ratio is often beneficial to the incorporation of group III atoms [9,10].…”
Section: Introductionmentioning
confidence: 99%
“…On one hand, the indium incorporation is difficult at high temperature due to weak binding energy to the surface [ 6 ]. Thus, the growth temperature of InGaN well layers is normally below 800 °C [ 7 ]. But at such low temperature, the diffusion rate of gallium will be restricted strongly, leading to three-dimensional growth of GaN barrier layers and poor surface morphology of MQW region [ 8 , 9 ].…”
Section: Introductionmentioning
confidence: 99%