We
introduced an organic interlayer into the Schottky contact interface
to control the contact property. After inserting an 11-nm-thick polyethylenimine
(PEI) interlayer between the aluminum (Al) source/drain electrode
and the cuprous oxide (Cu2O) channel layer, the Cu2O thin-film transistors (TFTs) exhibited improved electrical
characteristics compared with Cu2O TFTs without a PEI interlayer;
the field-effect mobility improved from 0.02 to 0.12 cm2/V s, the subthreshold swing decreased from 14.82 to 7.34 V/dec,
and the on/off current ratio increased from 2.43 × 102 to 1.47 × 103, respectively. Careful investigation
of the contact interface between the source/drain electrode and the
channel layer established that the performance improvements were caused
by the formation of electric dipoles in the PEI interlayer. These
electric dipoles reduced the Schottky barrier height by neutralizing
the charges at the metal/oxide semiconductor interface, and the holes
passed the reduced Schottky barrier by means of tunneling or thermionic
injection. In this way, p-type oxide TFTs, which generally need a
noble metal having a high work function as an electrode, were demonstrated
with a low-work-function metal. As a basic application for logic circuits,
a complementary inverter based on n-type indium–gallium–zinc
oxide and p-type Cu2O TFTs was fabricated using only Al
source/drain electrodes. This research achieved advances in low-cost
circuit design by broadening the electrode metals available for the
manufacture of p-type oxide semiconductor-based electronics.