2021
DOI: 10.3390/s21175955
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In-Line Measurement of the Surface Texture of Rolls Using Long Slender Piezoresistive Microprobes

Abstract: Long slender piezoresistive silicon microprobes are a new type of sensor for measurement of surface roughness. Their advantage is the ability to measure at speeds of up to 15 mm/s, which is much faster than conventional stylus probes. The drawbacks are their small measurement range and tendency to break easily when deflected by more than the allowed range of 1 mm. In this article, previously developed microprobes were tested in the laboratory to evaluate their metrological properties, then tested under industr… Show more

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Cited by 13 publications
(6 citation statements)
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“…In Equation ( 1), the Ra value can be defined as the arithmetic average of all actual values of variations in the surface profile measured along the whole distance from the centerline. The ISO 16610-211 standard was employed for analysis, with sample lengths (Ls) of 4.8 mm and cut-off wavelengths of 0.8 mm [60].…”
Section: Response Surface Methodologymentioning
confidence: 99%
“…In Equation ( 1), the Ra value can be defined as the arithmetic average of all actual values of variations in the surface profile measured along the whole distance from the centerline. The ISO 16610-211 standard was employed for analysis, with sample lengths (Ls) of 4.8 mm and cut-off wavelengths of 0.8 mm [60].…”
Section: Response Surface Methodologymentioning
confidence: 99%
“…Equation (2) describes the Rq of the profile height deviations taken within the evaluation length and measured from the mean line [ 58 ]. Analytically, it was measured using a sampling length ( Lt ) = 4.8 mm and a cut-off wavelength of 0.8 mm following the ISO 16610–211 standard [ 59 ]. Specifications of the JD520 model surface roughness tester are depicted in Table 4 .…”
Section: Methodsmentioning
confidence: 99%
“…The Ra value is defined by Equation (1) as the geometric mean of the absolute values of the surface profile deviations throughout the entire length away from the centerline. The ISO 16610-211 standard was used to analyze the samples, with a cut-off wavelength of 0.8 mm and a length (Lw) of 4.8 mm [65]. The results of three measurements were then averaged.…”
Section: Measurement Proceduresmentioning
confidence: 99%