In-line monitoring and quality control of flexible organic electronic materials

Laskarakis, A.; Logothetidis, S.

doi:10.1016/b978-1-78242-035-4.00010-5

Cited by 2 publications

References 54 publications

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Algorithmic presentation of printed electronics verification in-process

Нагорнова

Bablyuk

Lazareva

et al. 2019

J. Phys.: Conf. Ser.

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Printed electronics products manufacturing is in the emerging stage demanding both technological infrastructure and methodological procedures development including performance monitoring system organization. In the study the developed verification in-process algorithm for flexible and wearable electronics production in the case of RFID-antenna, strain-gauge sensor and OLED-pixels based on updated printing techniques and equipment is proposed. It was shown the most valuable monitoring factors impacting deliverable end item quality are production-driven roughness parameters substrate and the underlying layers (elements), their intermixing and thermal post-processing conditions. The tolerance checkpoints parameters, patterns of selected parameters interaction and optimal monitoring stages were fixed.

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Algorithmic presentation of printed electronics verification in-process

Нагорнова

Bablyuk

Lazareva

et al. 2019

J. Phys.: Conf. Ser.

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Transparent anisotropic films measurement with a polarized angle-resolved spectroscopy

Peng

Tang

Wang

et al. 2023

International Conference on Optical and Photonic Engineering (icOPEN 2022)

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Polarized angle-resolved spectroscopy is introduced to measure transparent anisotropic films with back focal plane imaging by virtue of its rich information provided at various incident and azimuthal angles. The polarized angle-resolved spectroscopy provides a conoscopic interferogram and angle-resolved spectrum to deal with the complex characterization parameters of an anisotropic film, including the thickness, principal refractive index, and optical axis. Firstly, the optics model of a transparent anisotropic film is built by superpositioning the incoherent waves from the front and rear surfaces with coherency matrices formalism when the optical length is larger than the coherent length, and the incoherent issue arises. Then the optical axis of the anisotropic sample can be determined by the conoscopic interference image with the melatope, which marks zero phase difference between the ordinary and extraordinary waves. The measured angle-resolved reflectance spectrum and anisotropic interference phase are fitted to the optics model of the film with coherency matrix formalism, utilizing the Levenberg-Marquardt algorithm to calculate the thickness and dispersion principal refractive index within a single shot. The thickness and anisotropic refractive index are determined for sapphire and polyethylene terephthalate (PET) samples with our homemade polarized angle-resolved spectrometer. The thickness measurement results show that the relative error of the proposed method is less than 1.45%.

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In-line monitoring and quality control of flexible organic electronic materials

Cited by 2 publications

References 54 publications

Algorithmic presentation of printed electronics verification in-process

Algorithmic presentation of printed electronics verification in-process

Transparent anisotropic films measurement with a polarized angle-resolved spectroscopy

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