2013
DOI: 10.1007/978-3-319-00765-6_14
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In-plane Shear Properties of High-Performance Filaments

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Cited by 3 publications
(2 citation statements)
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“…However, the methodology entails a large experimental scatter owing to the uncertainty in the determination of the exact defect size that caused the failure and the maximum stress attained during the experiments. The focused ion beam (FIB) opens revolutionary opportunities for testing materials at the microlevel by selective removing/carving material and generating complex geometries suitable for testing [1,2].…”
Section: Introductionmentioning
confidence: 99%
“…However, the methodology entails a large experimental scatter owing to the uncertainty in the determination of the exact defect size that caused the failure and the maximum stress attained during the experiments. The focused ion beam (FIB) opens revolutionary opportunities for testing materials at the microlevel by selective removing/carving material and generating complex geometries suitable for testing [1,2].…”
Section: Introductionmentioning
confidence: 99%
“…It is well suited for research efforts where only a small number of fibers may be available and can unveil key insights into the microstructure-property relationships governing the CF performance through inspection of pores, inclusions, and other irregularities in the fiber fracture surface [6]. Alternative methods, such as atomic force microscopy, nanoindentation, and picosecond ultrasonics, have been proposed but have not gained widespread adoption [5,[7][8][9]. ASTM C1557-20 is the most widely used method for tensile testing single fibers to determine their tensile strength, strain at break, and Young's modulus [10].…”
Section: Introductionmentioning
confidence: 99%