The 13th International Conference on Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDU 2005
DOI: 10.1109/sensor.2005.1497333
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In-process gap reduction of capacitive transducers

Abstract: This paper presents a MEMS fabrication technique for reducing the trench width of microstructures below the technological limitations of the deep reactive ion etching (DRIE) process, in order to increase the aspect ratio of the sensing electrode gap of capacitive transducers. The in-process trench width reduction is based on the displacement of a substructure actuated by a buckling beam mechanism. Compressive stress causes a longitudinal force in the acting beams which results in the buckling to a predefined d… Show more

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Cited by 5 publications
(6 citation statements)
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“…Different approaches are distinguished between the in‐process and post‐process gap reduction (GR) techniques.…”
Section: Gap Reductionmentioning
confidence: 99%
“…Different approaches are distinguished between the in‐process and post‐process gap reduction (GR) techniques.…”
Section: Gap Reductionmentioning
confidence: 99%
“…The fabrication of sub-micron trenches [5][6][7][8][9][10] or structures with very high aspect ratios up to 100 [6] is advantageous for many applications. To increase the aspect ratio of the sensing electrode gap, different technologies for reduction of trench width of capacitive micro structures below the technological limitations have been proposed and demonstrated in recent years [11][12][13][14][15].…”
Section: Fabrication Technique Figure 1 Schematic Process Flows Of Tmentioning
confidence: 99%
“…Using ratchet structures or bistable mechanisms for locking the reduced gap are critical for the reliability of the transducers. An inprocess gap reduction approach [14] utilizes residual stress in microstructures, coated with silicon dioxide. However, the technique causes a high temperature sensitivity of the microstructures.…”
Section: Fabrication Technique Figure 1 Schematic Process Flows Of Tmentioning
confidence: 99%
“…However, fabrication restrictions limit the minimum size of the spacing between the electrodes. Therefore, the reduction of the trench width after patterning of the microstructures has been proposed and demonstrated by different groups in recent years [1][2][3][4].…”
Section: Introductionmentioning
confidence: 99%
“…Using ratchet structures or bistable mechanisms for locking the reduced gaps could be critical for the reliability of the device. An in-process gap reduction approach, which has been developed recently in our group [4], utilizes residual stress in microstructures, coated with silicon dioxide. However, the technique causes a high temperature sensitivity of the microstructures.…”
Section: Introductionmentioning
confidence: 99%