The cos method for X-ray residual stress measurement using two-dimensional detector Abstract X-ray stress measurement is widely used as one of the most powerful nondestructive tools to measure residual stresses in polycrystalline solids. In most cases, the sin 2 method has been used to determine the stress. In recent years, however, the cos method has attracted engineers as a new method to measure the stress using twodimensional detectors, such as imaging plates. The present article is the review of the state of the art of the cosmethod. For biaxial stress cases, the cos method utilizes the whole Debye-Scherrer ring recorded on a twodimensional detector taken by single exposure of X-rays, and normal and shear stresses are determined simultaneously. The accuracy of the stress measurement of the cos method has been confirmed to be equivalent to that of the sin 2 method for various metals. The simple optical system of the cos method makes stress analyzers smaller, lighter and more convenient to use for on-site or field measurements. A recent portable stress analyzer adopting the cos method shortens the measurement time to 60 s. The method has been further developed to analyze triaxial residual stresses. Various advantages of the cos method are highlighted in comparison with the other methods of X-ray stress determination. Applications of the cos method to machines and engineering structures are presented, together with future perspectives of the method.