In Situ Deformation by High Voltage Electron Microscopy

Abstract

It is well known that materials are structure-sensitive. This means that properties of materials, especially mechanical properties, are determined by behavior of the lattice imperfections such as dislocations and point defects. High resolution and quick recording of the images by electron microscopy have been effectively used for studying behavior of lattice imperfections. It is very difficult, however, to get a definite conclusion about the deformation processes based on the static electron microscope observation of the dislocation structures formed by deformation, because many processes can be considered to get the same dislocation structure. Therefore, dynamic study of the behavior of lattice imperfections is necessary to carry out in order to investigate the properties of materials.