“…Several studies addressed the film formation process with the help of in situ measurements. They mainly were using scattering methods, − which allowed to identify the important role of, for example, additives, the exact process conditions, or the morphology of precursor layers. ,− In addition to scattering methods, other techniques such as optical spectroscopy are also suitable to study the formation of semiconductor films from solution. , This is because the crystallographic structure of the perovskite is very sensitively linked to its electronic structure and thus to its optical properties. Hence, in situ optical spectroscopy has become increasingly popular, often complementing in situ scattering experiments, for example, to identify different crystallization phases and their timing in the film-formation process. ,, In addition, driven by in situ optical characterizations, some studies could gain more detailed insights about the nucleation and growth dynamics or about the perovskite growth at the early stage of film formation. , Recently, we and others investigated the formation of perovskites in detail by a simultaneous measurement of photoluminescence (PL) and absorption or reflection, further demonstrating the potential of optical in situ spectroscopy during the processing of halide perovskites. , Spurred by recent technological and analytical advances, , an optical in situ monitoring during film processing has become relatively easily accessible.…”