2018
DOI: 10.1021/acs.jpca.8b06248
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In Situ Measurement of Exciton Dynamics During Thin-Film Formation Using Single-Shot Transient Absorption

Abstract: The exciton dynamics of pseudoisocyanine (PIC) is reported during the formation of a thin film dropcast from solution. Tilted pump pulses are used to spatially encode a pump-probe time delay, enabling the collection of a transient in a single shot. We demonstrate that a spatially encoded delay can be used to accurately measure exciton dynamics in thin-film samples, with a signal-to-noise ratio above 20 attained in 2 s. We report in situ linear absorption, fluorescence, and transient absorption measurements dur… Show more

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Cited by 13 publications
(7 citation statements)
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“…[8,11,12] Thus, numerous works investigated the perovskite formation process using in situ characterization methods. [6,[13][14][15][16][17][18] Besides scattering techniques, [19][20][21][22][23][24] also optical spectroscopy, [25][26][27][28] with, e.g., absorption…”
Section: Introductionmentioning
confidence: 99%
“…[8,11,12] Thus, numerous works investigated the perovskite formation process using in situ characterization methods. [6,[13][14][15][16][17][18] Besides scattering techniques, [19][20][21][22][23][24] also optical spectroscopy, [25][26][27][28] with, e.g., absorption…”
Section: Introductionmentioning
confidence: 99%
“…Our studies have focused exclusively on the temporal response of the photosynthetic apparatus to high-light exposure, but the snapshot TA technique is potentially valuable for tracking the excited state population and dynamics within any sample that changes over time. Some examples of this include tracking processes such as in situ thin-film formation for photovoltaic applications (Hernandez et al 2015;Wilson and Wong 2018) and degradation of perovskites by moisture/ O 2 (Wang et al 2015;Ginting et al 2017).…”
Section: Discussionmentioning
confidence: 99%
“…Several studies addressed the film formation process with the help of in situ measurements. They mainly were using scattering methods, which allowed to identify the important role of, for example, additives, the exact process conditions, or the morphology of precursor layers. , In addition to scattering methods, other techniques such as optical spectroscopy are also suitable to study the formation of semiconductor films from solution. , This is because the crystallographic structure of the perovskite is very sensitively linked to its electronic structure and thus to its optical properties. Hence, in situ optical spectroscopy has become increasingly popular, often complementing in situ scattering experiments, for example, to identify different crystallization phases and their timing in the film-formation process. ,, In addition, driven by in situ optical characterizations, some studies could gain more detailed insights about the nucleation and growth dynamics or about the perovskite growth at the early stage of film formation. , Recently, we and others investigated the formation of perovskites in detail by a simultaneous measurement of photoluminescence (PL) and absorption or reflection, further demonstrating the potential of optical in situ spectroscopy during the processing of halide perovskites. , Spurred by recent technological and analytical advances, , an optical in situ monitoring during film processing has become relatively easily accessible.…”
Section: Introductionmentioning
confidence: 99%