2006
DOI: 10.1016/j.corsci.2004.11.027
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In-situ measurements by impedance spectroscopy of highly resistive α-alumina

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Cited by 18 publications
(20 citation statements)
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“…EIS, interfacial polarization) fixing the energy barrier for Al and O self-diffusion in the range 0.8-2.4 eV [29,34,43,48]. Such values are in agreement with those found in this study and perfectly match with those (0.7 and 2.5 eV) obtained by theoretical calculation [26,27,49,50].…”
Section: Resultssupporting
confidence: 93%
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“…EIS, interfacial polarization) fixing the energy barrier for Al and O self-diffusion in the range 0.8-2.4 eV [29,34,43,48]. Such values are in agreement with those found in this study and perfectly match with those (0.7 and 2.5 eV) obtained by theoretical calculation [26,27,49,50].…”
Section: Resultssupporting
confidence: 93%
“…The activation energy was estimated as 1.2 ± 0.2, 1.2 ± 0.1, 1.0 ± 0.2 eV for platinum, carbon and silver electrodes, respectively. Similar results were found by Cologna et al [34] who worked with dense alumina bodies. The calculated activation energies are far lower than the band gap for pure corundum (8.7-10.8 eV) [36][37][38][39].…”
Section: Resultssupporting
confidence: 91%
“…3, where the impedance data are plotted as -Z 00 vs. Z 0 . In this case, essentially only one semicircle is seen from the plots, which is similar to that of sintered polycrystalline and single-crystalline a-alumina [24,27]. The ''depressed'' appearance of the semicircle is due to the fact that the alumina scale does not behave as a perfect dielectric, unlike pure a-alumina.…”
Section: Af1000mentioning
confidence: 76%
“…The reason for the low t i value obtained in this work is not straightforward. The effect of surface conduction [24] was investigated, but that measurement showed the same low t i on a similar sample (data unpublished). Leakage currents due to poor insulation of the sample holder could be a source of error.…”
Section: Ionic Transference Numbermentioning
confidence: 98%
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