2019
DOI: 10.1016/j.corsci.2019.108112
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In-situ optical view onto copper oxidation – role of reactive interfaces and self-heating

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Cited by 18 publications
(25 citation statements)
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“…Although the statistical basis of our study is small, a corresponding plot seems to support this relation. Our reasoning is supported by the activation energy for Cu oxidation, as derived from the temperature‐dependent reaction rates discussed in our earlier work . The deduced barrier height of 35 kJ mol −1 is in good agreement with grain boundary diffusion yet much lower than for bulk diffusion.…”
Section: Resultssupporting
confidence: 83%
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“…Although the statistical basis of our study is small, a corresponding plot seems to support this relation. Our reasoning is supported by the activation energy for Cu oxidation, as derived from the temperature‐dependent reaction rates discussed in our earlier work . The deduced barrier height of 35 kJ mol −1 is in good agreement with grain boundary diffusion yet much lower than for bulk diffusion.…”
Section: Resultssupporting
confidence: 83%
“…The deduced barrier height of 35 kJ mol −1 is in good agreement with grain boundary diffusion yet much lower than for bulk diffusion. A particular role of grain boundaries was also suggested from transmission electron microscopy data that successfully visualized the preferred copper oxidation along boundary defects . Finally, we have tested a possible interplay between measured oxidation rates and surface roughness of the five different Cu samples; however, could not reveal a convincing relationship (Figure c).…”
Section: Resultsmentioning
confidence: 94%
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