For a long time, polymer lamellar
crystals were hard to characterize
accurately and comprehensively. The main reason is that the small-angle
X-ray scattering (SAXS) mechanism of semicrystalline polymers has
not been elucidated thoroughly. In recent years, we examined SAXS
in semicrystalline polymers carefully, finding that SAXS in semicrystalline
polymers probably is from a new physical mechanism, that is, evanescent
wave-induced scattering. Based on the finding, a full set of new characterization
methodologies for lamellar stack were proposed. In this study, to
help more researchers to understand the new theory and methodologies,
we introduce our new theory and methodologies systematically, with
poly(1-butene) as an example. Results indicate that the new methods
can extract effectively the structural information during the isothermal
crystallization, phase transition, and melting of poly(1-butene),
i.e., the lamellar thickness, long period, and lateral size. With
the methods, it was found that the lamellar crystal as a whole can
contract by 20% ± 4.5% in the lateral size and elongate by 12%
along the chain direction during the phase transition, in agreement
with the theoretical prediction. This conversely indicates the validation
of the new theory. Initial evidence for the existence of the evanescent
wave was also given. It is expected that, with this study, more researchers
can better employ synchrotron SAXS to study polymer crystallization
issues.