2019 IEEE 9th International Nanoelectronics Conferences (INEC) 2019
DOI: 10.1109/inec.2019.8853861
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In-situ Real-Time Observation of Sn-Rich Dots and Wires During Annealing of GeSn Epitaxial Films

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“…14,26 The recent in situ experiment under SEM and optical microscopy also provide evidence of the formation of the trenches during the annealing of the GeSn layers. 14,15 To reduce the Gibbs free energy, the Sn droplets migrate toward the supersaturated and strained GeSn epilayers and leave the strain-free and stable Ge (or low-Sn-content GeSn) layer behind (details in section 3.3). The Sn droplets and low-Sn-content trenches in GeSn can also be further verified from the EDS mapping of Ge and Sn elements in Figure 1e similar to the growth of the lateral Si nanowires by the SLS method, wherein the droplets move on the unstable Si amorphous film during annealing, resulting in the stable singlecrystal Si nanowires.…”
Section: Resultsmentioning
confidence: 99%
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“…14,26 The recent in situ experiment under SEM and optical microscopy also provide evidence of the formation of the trenches during the annealing of the GeSn layers. 14,15 To reduce the Gibbs free energy, the Sn droplets migrate toward the supersaturated and strained GeSn epilayers and leave the strain-free and stable Ge (or low-Sn-content GeSn) layer behind (details in section 3.3). The Sn droplets and low-Sn-content trenches in GeSn can also be further verified from the EDS mapping of Ge and Sn elements in Figure 1e similar to the growth of the lateral Si nanowires by the SLS method, wherein the droplets move on the unstable Si amorphous film during annealing, resulting in the stable singlecrystal Si nanowires.…”
Section: Resultsmentioning
confidence: 99%
“…15 The higher activation energy can be attributed to the highly stable (111) surface. 15 As compared to the work reported by Ong et al, the activation energy of the Ge 0.9 Sn 0.1 sample in our work is about a quarter, indicating the lower stability of the Ge 0.9 Sn 0.1 due to the higher Sn content. Nevertheless, it is challenging to assess the activation energy of the Ge 0.885 Sn 0.115 sample due to the decrease in spot size when the annealing temperature increases.…”
Section: Resultsmentioning
confidence: 99%
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