Synopsis:The performance of the XMaS beamline for soft X-ray spectroscopy in the 2-4 keV range is assessed with particular relation to in situ studies of functional materials and their chemistry. X-ray spectroscopy for chemistry in the 2-4 keV energy regime at the XMaS beamline: ionic liquids, Rh and Pd catalysts in gas and liquid environments, and Cl contamination in c-Al 2 O 3
How to cite your article in pressYour article has not yet been assigned page numbers, but may be cited using the doi:Thompson, P.B.J., Nguyen, B.N., Nicholls, R., Bourne, R.A., Brazier, J.B., Lovelock, K.R.J., Brown, S.D., Wermeille, D., Bikondoa, O., Lucas, C.A. et al. (2015). J. Synchrotron Rad. 22, doi:10.1107/S1600577515016148.You will be sent the full citation when your article is published and also given instructions on how to download an electronic reprint of your article.
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Thumbnail image for contents pageFiles: s/rv5038/rv5038.3d s/rv5038/rv5038.sgml RV5038 FA IU-1517/10(15)9 1516/52(15)9 () RV5038 http://dx.doi.org/10.1107/S1600577515016148 1 of 14 The 2-4 keV energy range provides a rich window into many facets of materials science and chemistry. Within this window, P, S, Cl, K and Ca K-edges may be found along with the L-edges of industrially important elements from Y through to Sn. Yet, relative to those that cater for energies above ca. 4-5 keV, there are relatively few resources available for X-ray spectroscopy below these energies. In addition, in situ or operando studies become to varying degrees more challenging than at higher X-ray energies due to restrictions imposed by the lower energies of the X-rays upon the design and construction of appropriate sample environments. The XMaS beamline at the ESRF has recently made efforts to extend its operational energy range to include this softer end of the X-ray spectrum. In this report the resulting performance of this resource for X-ray spectroscopy is detailed with specific attention drawn to: understanding electrostatic and charge transfer effects at the S K-edge in ionic liquids; quantification of dilution limits at the Cl K-and Rh L 3 -edges and structural equilibria in solution; in vacuum deposition and reduction of [Rh I (CO) 2 Cl] 2 to -Al 2 ...