2019
DOI: 10.1016/j.ndteint.2019.04.012
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In-situ thickness measurement of epoxy molding compound in semiconductor package products using a Terahertz-Time of Flight System

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Cited by 20 publications
(5 citation statements)
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“…The presence of epoxy molding compounds (EMCs) in the package generally might affect the performance of encapsulated detectors, and this influence needs to be evaluated. Multiple studies of various EMCs in the THz range [ 29 , 30 , 31 ] indicated their very similar refractive index values of , n = 1.897–1.940, and , respectively. The obtained small variations of the refractive index were attributed to differences in the silica filler content [ 30 ].…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…The presence of epoxy molding compounds (EMCs) in the package generally might affect the performance of encapsulated detectors, and this influence needs to be evaluated. Multiple studies of various EMCs in the THz range [ 29 , 30 , 31 ] indicated their very similar refractive index values of , n = 1.897–1.940, and , respectively. The obtained small variations of the refractive index were attributed to differences in the silica filler content [ 30 ].…”
Section: Methodsmentioning
confidence: 99%
“…Multiple studies of various EMCs in the THz range [ 29 , 30 , 31 ] indicated their very similar refractive index values of , n = 1.897–1.940, and , respectively. The obtained small variations of the refractive index were attributed to differences in the silica filler content [ 30 ]. Such refractive index values can possibly lead to front surface reflectance of the order of 11%, but can also contribute to a more gradual refractive index transition between the free space and the HEMT substrate.…”
Section: Methodsmentioning
confidence: 99%
“…By utilizing the normal reflection and transmission modes of THz-TDS, it is possible to simultaneously measure the refractive index and thickness of EMC materials. 29 This simultaneous measurement presents a significant advancement in material characterization techniques. However, this method faces limitations when applied to non-transparent samples, such as HI packaging that consists of multiple layers.…”
Section: Materials and Structure Measurementmentioning
confidence: 99%
“…In non-contact measurement, there are active and passive measurement methods. The terahertz-time of flight system, digital holographic interferometry and structured light, which are typical active methods, have fast measurement speeds and high precision [ 11 , 12 , 13 ]. However, active methods require extra devices to generate specific signals, increasing the complexity and cost of the equipment.…”
Section: Introductionmentioning
confidence: 99%