In Situ Transmission Electron Microscopy

Ross, Frances M.

doi:10.1007/978-0-387-49762-4_6

Cited by 15 publications

(8 citation statements)

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“…mechanical or (electro) chemical testing, heating/cooling, radiation damage experiments, and gas (vapor)-solid chemical reactions in environmental cells). (72,73) These capabilities essentially expand the use of electron beams for studies of dynamic processes and reactions in real time (see Section 9.1 for examples). The concept of the material processing laboratory in an EM, which allows several high spatial resolution analytical modes to be combined with experiments that are traditionally carried out ex situ, is highly attractive for solving a number of problems in strategic R&D areas identified as having the potential to realize significant economic, governmental, and societal impacts.…”

Section: In Situ Electron Microscopymentioning

confidence: 99%

Electron Microscopy, Nanoscopy, and Scanning Micro‐ and NanoanalysisUpdate based on the original article by Vladimir Oleshko, Renaat Gijbels and Severin Amelinckx,Encyclopedia of Analytical Chemistry, © 2000, John Wiley & Sons, Ltd

Oleshko

Gijbels

Amelinckx

2013

Encyclopedia of Analytical Chemistry

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The article considers the history and stages of development of electron microscopy (EM) and scanning microanalysis, including theoretical aspects of electron beam–solid interactions, instrumentation, methodology of particular techniques and image analysis, sample preparation, and some typical applications as well. Major classes of EM techniques, i.e. stationary beam (transmission) and scanning beam EM methods, analytical electron microscopy (AEM), in situ EM, holography, and tomography are overviewed. In AEM, several imaging, diffraction, and analytical modes are integrated in a design to provide analytical synergism having obvious advantages over any single instrument. The subject of EM is to determine the morphology, crystallinity, defect structure, phase and elemental compositions, and electronic properties of a material using the focused electron beam and signals generated in the course of its interaction with the specimen. Various electron–specimen interactions generate a great deal of structural and analytical information in the form of emitted electrons and/or photons and internally produced signals, such as elastically and inelastically scattered electrons, Auger electrons (AEs), X‐rays, and cathodoluminescence (CL), which can be analyzed in different operating modes. Imaging of solid materials is essentially due to elastic scattering (diffraction) of electrons by the periodic arrangement of atoms in crystals (diffraction contrast) and/or interference of several diffracted and transmitted beams (phase contrast). High‐resolution imaging in scanning transmission mode is possible by using incoherently scattered electrons (Z‐contrast). Inelastic interactions form the basis for all chemical analytical techniques (energy‐dispersive (EDS) and wavelength‐dispersive (WDS) X‐ray spectroscopy, electron energy‐loss spectroscopy (EELS) energy‐filtering transmission electron microscopy (EFTEM), AE‐, and CL‐spectroscopy). The introduction of aberration‐corrected and monochromatic electron optics during the last decade opened a new era of nanoscopy and nanoanalysis at sub‐0.1 nm lateral resolution and sub‐electronvolt energy resolution levels with improved signal‐to‐noise ratio (SNR). Basic data characterizing the current state‐of‐the‐art and trends in development of electron nanoscopy and nanoanalysis are presented.

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Section: In Situ Electron Microscopymentioning

confidence: 99%

Electron Microscopy, Nanoscopy, and Scanning Micro‐ and NanoanalysisUpdate based on the original article by Vladimir Oleshko, Renaat Gijbels and Severin Amelinckx,Encyclopedia of Analytical Chemistry, © 2000, John Wiley & Sons, Ltd

Oleshko

Gijbels

Amelinckx

2013

Encyclopedia of Analytical Chemistry

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“…The challenge is to experimentally obtain sufficient spatial resolution to capture plastic localization events such as slip bands, PSBs, shear bands, while investigating regions that are large enough to statistically capture the microstructures that influence properties such as fatigue. Current experimental techniques used to explore plastic localization include: in-situ transmission electron microscopy [11], micro-pillar compression [12], in-situ scanning electron microscopy [13e17], in-situ synchrotron experiments [18], and atomic force microscopy measurements [19,20]. However, all these techniques either probe small volumes of material or have complex boundary conditions that make them statistically non-representative.…”

Section: Introductionmentioning

confidence: 99%

Measurements of plastic localization by heaviside-digital image correlation

et al. 2018

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In polycrystalline metallic materials, quantitative and statistical assessment of the plasticity in relation to the microstructure is necessary to understand the deformation processes during mechanical loading. Plastic deformation often localizes into physical slip bands at the sub-grain scale. Detrimental microstructural configurations that result in the formation and evolution of slip bands during loading require advanced strain mapping techniques for the identification of these atomically sharp discontinuities. A new discontinuity-tolerant DIC method, Heaviside-DIC, has been developed to account for discontinuities in the displacement field. Displacement fields have been measured at the scale of the physical slip bands over large areas in nickel-based superalloys by high resolution scanning electron microscopy digital image correlation (SEM DIC). However, conventional DIC methods cannot quantitatively measure plastic localization in the presence of discontinuous kinematic fields such as those produced by slip bands. The Heaviside-DIC technique can autonomously detect discontinuities, providing information about their location, inclination, and identify slip systems (in combination with orientation mapping). Using Heaviside-DIC, discontinuities are physically evaluated as sharp shear-localization events, allowing for the quantitative measure of strain amplitude nearby the discontinuities. Measurements using the new Heaviside-DIC technique are compared to conventional DIC methods for identical materials and imaging conditions.

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“…8. In situ TEM STM can be used to study the friction and wear of a number of materials including, but not limited to, graphite, diamond-like carbon, and metal films [5,22]. Figure 9 shows an example of an in situ TEM friction and wear study conducted on graphite.…”

Section: Friction/wear Testing Applicationsmentioning

confidence: 99%

“…EELS, on the other hand, detects the energy distribution of electrons that have passed through a sample allowing for a determination of the chemical bonding and electronic structure of the sample by analysis of the spectrum of the electron energies and in particular the energy lost to inelastic scattering [1]. With application to in situ TEM mechanical testing, EELS has been used, for example, to study changes in the electronic structure of carbon-based nanostructures such as carbon nanotubes that are subjected to bending deformations [5]. EELS has also been used to identify changes in the ratio of sp 2 vs. sp 3 bonding in diamond-like carbon films subjected to mechanical sliding between a tungsten tip and the films in situ TEM [7].…”

Section: Simultaneous Tem Characterization Toolsmentioning

confidence: 99%

“…For a comprehensive in-depth and historical review of the field of in situ TEM mechanical testing, the reader is referred to the recent review article by Legros [2]. Since its inception several decades ago, in situ TEM mechanical testing has made notable advances to enable quantitative mechanical testing configurations, which include (i) tension and compression, (ii) nanoindentation, (iii) bending, and (iv) friction and wear testing [3][4][5]. These various mechanical testing configurations, executed within the full view of the TEM, have enabled a detailed understanding of the mechanics of materials with micro-and nano-confined structures elucidating a number of size-scale phenomena.…”

Section: Introductionmentioning

confidence: 99%

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