2015
DOI: 10.1039/c5tc02553b
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In situ X-ray diffraction study of the controlled oxidation and reduction in the V–O system for the synthesis of VO2 and V2O3 thin films

Abstract: VO2 and V2O3 thin films were prepared during in situ XRD investigation by oxidation and reduction of V and V2O5. Films show up to 5 orders of magnitude resistance switching.

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Cited by 61 publications
(42 citation statements)
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“…This is in good agreement with the temperature range of 450−550°C previously reported to be optimal for this purpose. 44 The oxidation process requires an extended time of annealing at lower temperatures. For example, 1 h is needed when the annealing temperature is 300°C…”
Section: ■ Results and Discussionmentioning
confidence: 99%
“…This is in good agreement with the temperature range of 450−550°C previously reported to be optimal for this purpose. 44 The oxidation process requires an extended time of annealing at lower temperatures. For example, 1 h is needed when the annealing temperature is 300°C…”
Section: ■ Results and Discussionmentioning
confidence: 99%
“…Authors could evidence the coexistence of M2 and R phases in this temperature range, and show their comparable electrical resistivity49. Although it seems to be overlooked, the negative TCR above SMT is visible in results displayed in several reports294449. Jones et al 50.…”
Section: Resultsmentioning
confidence: 91%
“…Ideally, VO 2 films show 3–4 orders of magnitude resistivity change with a narrow hysteresis width of ΔT~ 3–4 K. Bulk single crystal offers slightly higher amplitude of resistivity change but is susceptible to breakdown after few cycles of switching between semiconducting and metallic phases27. Although, polycrystalline thin films withstand frequent cycling, they usually feature broad hysteresis and small amplitudes of resistivity change, due to the presence of high density of grain boundaries and grain-boundary defects232829. Sintering as-grown VO 2 films to decrease the density of grain boundaries is not conceivable for practical applications due to the high melting point of this phase (1970 °C).…”
mentioning
confidence: 99%
“…For more details, the reader is redirected to previous work [17,18]. For more details, the reader is redirected to previous work [17,18].…”
Section: Experimental Methodsmentioning
confidence: 99%